Presentation 2004/11/25
Analysis on Error Masking Rate for Convolutional Compactors
Masayuki ARAI, Satoshi FUKUMOTO, Kazuhiko IWASAKI,
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Abstract(in English) Convolutional compactors offer a promising technique of compacting test responses that include unknown values. One drawback of this compaction technique is error masking, i.e., some errors appearing in the test responses cannot be detected due to mutual cancellation. In this work, we theoretically analyze error-masking probability. First, we apply weight distributions of binary linear error-correcting codes to derive the error-masking probability. We then present a fast calculation scheme for 4- and 6-error-masking probabilities. Numerical examples reveal that they are about the same as those obtained by Monte-Carlo simulations. We also found that the masking probability as a function of test length has a peak value for constant error probabilities, such as 0.01, and 0.001.
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Keyword(in English) Convolutional compactor / test response compactor / error masking rate / dual code / weight distribution
Paper # VLD2004-75,ICD2004-161,DC2004-61
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Conference Date 2004/11/25(1days)
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Registration To Integrated Circuits and Devices (ICD)
Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Analysis on Error Masking Rate for Convolutional Compactors
Sub Title (in English)
Keyword(1) Convolutional compactor
Keyword(2) test response compactor
Keyword(3) error masking rate
Keyword(4) dual code
Keyword(5) weight distribution
1st Author's Name Masayuki ARAI
1st Author's Affiliation Graduate School of Engineering, Tokyo Metropolitan University()
2nd Author's Name Satoshi FUKUMOTO
2nd Author's Affiliation Graduate School of Engineering, Tokyo Metropolitan University
3rd Author's Name Kazuhiko IWASAKI
3rd Author's Affiliation Graduate School of Engineering, Tokyo Metropolitan University
Date 2004/11/25
Paper # VLD2004-75,ICD2004-161,DC2004-61
Volume (vol) vol.104
Number (no) 480
Page pp.pp.-
#Pages 6
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