| Presentation | 2004/11/25 Diagnosis for Multiple Stuck-at Faults by Ambiguous Test Set Yukihiro YAMAMOTO, Hiroshi TAKAHASHI, Yoshinobu HIGAMI, Yuzo TAKAMATSU, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | With the scaling of LSI feature size and increasing complexity of LSI, it is necessary to develop a method for diagnosing multiple stuck-at faults. Recently, the fault diagnosis under Built-in Self Test (BIST) environment is demanded because BIST is as effective in testing. However, the fault diagnosis under BIST environment is more difficult because only limited information for making the test set for diagnosis is available in highly compacted signatures. Therefore the detecting test set that is identified in BIST session includes un-detecting tests. In this paper, we propose a method for diagnosing multiple stuck-at faults under BIST environment. The fundamental features of the method are 1) to deduce candidate fautls in recognizing that the number of detected faults are difference among tests in the ambigous detecting test set, 2) to remove the candidate faults that are detected N times by un-detecting tests to reduce the number of candidate faults, and 3) to rank the candidate faults based on the information about detection times in the detecting tests and the un-detecting tests and the information about circuit structure. Finally we evaluate the effectiveness of the proposed method by experiments- conducted on the ISCAS benchmark circuits. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Built-in Self Test (BIST) / fault diagnosis / multiple stuck-at faults / ambiguous test set |
| Paper # | VLD2004-69,ICD2004-155,DC2004-55 |
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| Conference Information | |
| Committee | ICD |
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| Conference Date | 2004/11/25(1days) |
| Place (in Japanese) | (See Japanese page) |
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| Topics (in Japanese) | (See Japanese page) |
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| Registration To | Integrated Circuits and Devices (ICD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Diagnosis for Multiple Stuck-at Faults by Ambiguous Test Set |
| Sub Title (in English) | |
| Keyword(1) | Built-in Self Test (BIST) |
| Keyword(2) | fault diagnosis |
| Keyword(3) | multiple stuck-at faults |
| Keyword(4) | ambiguous test set |
| 1st Author's Name | Yukihiro YAMAMOTO |
| 1st Author's Affiliation | Graduate School of Science and Engineering^ Ehime University() |
| 2nd Author's Name | Hiroshi TAKAHASHI |
| 2nd Author's Affiliation | Dept. of Computer Science, Faculty of Engineering, Ehime University |
| 3rd Author's Name | Yoshinobu HIGAMI |
| 3rd Author's Affiliation | Dept. of Computer Science, Faculty of Engineering, Ehime University |
| 4th Author's Name | Yuzo TAKAMATSU |
| 4th Author's Affiliation | Dept. of Computer Science, Faculty of Engineering, Ehime University |
| Date | 2004/11/25 |
| Paper # | VLD2004-69,ICD2004-155,DC2004-55 |
| Volume (vol) | vol.104 |
| Number (no) | 480 |
| Page | pp.pp.- |
| #Pages | 6 |
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