| Presentation | 2005/4/15 Photo-induced doping of organic field effect transistors studied by displacement current measurement and infrared absorption spectroscopy in the multiple internal reflection geometry : Charge transfer phenomenon between organic film and oxygen molecule Satoshi OGAWA, Tatsuo NAIJO, Yasuo KIMURA, Hisao ISHII, Michio NIWANO, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Organic field effect transistors (OFETs) have attracted much attention in relation to the recent progress in organic electronics. In order to investigate a mechanism of doping to organic semiconductors, we investigated the influence of oxygen exposure to pentacene and poly (3-hexylthiophen)(P3HT) FET using displacement current measurement (DCM) and infrared absorption spectroscopy in the multiple internal reflection geometry (MIR-IRAS). The DCM results revealed that the oxygen doping effect is small in dark condition, but is much enphanced by light illumination (photo-induced doping). From MIR-IRAS, we conclude that the charge-transfer reaction is accelerated by the light illumination. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Field effect transistors / Displacement current measurement / OFETs / carrier injection |
| Paper # | ED2005-11,SDM2005-11,OME2005-11 |
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| Conference Information | |
| Committee | SDM |
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| Conference Date | 2005/4/15(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Silicon Device and Materials (SDM) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Photo-induced doping of organic field effect transistors studied by displacement current measurement and infrared absorption spectroscopy in the multiple internal reflection geometry : Charge transfer phenomenon between organic film and oxygen molecule |
| Sub Title (in English) | |
| Keyword(1) | Field effect transistors |
| Keyword(2) | Displacement current measurement |
| Keyword(3) | OFETs |
| Keyword(4) | carrier injection |
| 1st Author's Name | Satoshi OGAWA |
| 1st Author's Affiliation | Tohoku university Research Institute of Electrical Communication (RIEC)() |
| 2nd Author's Name | Tatsuo NAIJO |
| 2nd Author's Affiliation | Tohoku university Research Institute of Electrical Communication (RIEC) |
| 3rd Author's Name | Yasuo KIMURA |
| 3rd Author's Affiliation | Tohoku university Research Institute of Electrical Communication (RIEC):Core Research for Evolutional Science and Technology (CREST) |
| 4th Author's Name | Hisao ISHII |
| 4th Author's Affiliation | Tohoku university Research Institute of Electrical Communication (RIEC):Core Research for Evolutional Science and Technology (CREST) |
| 5th Author's Name | Michio NIWANO |
| 5th Author's Affiliation | Tohoku university Research Institute of Electrical Communication (RIEC):Core Research for Evolutional Science and Technology (CREST) |
| Date | 2005/4/15 |
| Paper # | ED2005-11,SDM2005-11,OME2005-11 |
| Volume (vol) | vol.105 |
| Number (no) | 21 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |