Presentation 2005/1/14
Room-Temperature Demonstration of Current Switching and Analog Pattern Matching Using Integrated Silicon Single-Electron Transistor Circuits
Masumi SAITOH, Hidehiro HARATA, Toshiro HIRAMOTO,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) This paper reports the first room-temperature (RT) operation of integrated single-electron transistor (SET) circuits. We fabricate silicon single-hole transistors (SHTs) with high controllability and observe ultra-large Coulomb blockade (CB) oscillation with the peak-to-valley current ratio of over 10^3 at RT. Current switching operation using two SHTs integrated under a single gate is demonstrated at RT. We propose a novel application of SHTs, an ultra-compact analog pattern matching circuit. Its basic operation is demonstrated at RT using three SHTs fabricated on one chip, whose CB peak positions and currents are properly controlled by hole injection into silicon nanocrystals embedded in the gate oxide.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) single-electron transistor / single-hole transistor / ultra-narrow wire channel / Coulomb blockade oscillation / room temperature operation / current switch / pattern matching / silicon nanocrystals / integrated circuit / analog circuit
Paper # SDM2004-213
Date of Issue

Conference Information
Committee SDM
Conference Date 2005/1/14(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Silicon Device and Materials (SDM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Room-Temperature Demonstration of Current Switching and Analog Pattern Matching Using Integrated Silicon Single-Electron Transistor Circuits
Sub Title (in English)
Keyword(1) single-electron transistor
Keyword(2) single-hole transistor
Keyword(3) ultra-narrow wire channel
Keyword(4) Coulomb blockade oscillation
Keyword(5) room temperature operation
Keyword(6) current switch
Keyword(7) pattern matching
Keyword(8) silicon nanocrystals
Keyword(9) integrated circuit
Keyword(10) analog circuit
1st Author's Name Masumi SAITOH
1st Author's Affiliation Institute of Industrial Science, University of Tokyo()
2nd Author's Name Hidehiro HARATA
2nd Author's Affiliation Institute of Industrial Science, University of Tokyo:Graduate School of Science and Engineering, Chuo University
3rd Author's Name Toshiro HIRAMOTO
3rd Author's Affiliation Institute of Industrial Science, University of Tokyo
Date 2005/1/14
Paper # SDM2004-213
Volume (vol) vol.104
Number (no) 577
Page pp.pp.-
#Pages 4
Date of Issue