Presentation 2005-01-17
Response time performances of polymer dispersed nematic liquid crystal for layer thickness
Katsuhiko SAITO, Toshihisa KAMEI, Hiroshi MORITAKE, Yozo UTSUMI,
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Abstract(in English) We measured how the response time characteristics of the microstrip-line type PDLC(polymer dispersed liquid crystal) devices. The physical significance of these results was also examined. By varying the PDLC layer thickness with a polymer concentration of 5wt% or 9wr% and keeping the applied electric field constant, we show that increasing the layer thickness causes the decay time to increase and the rise time to decrease. In the case of a polymer concentration of 5wt%, the rise time obtained with a PDLC layer thickness of 100μm is half the value obtained with thickness of 20μm, while the decay time is approximately 3.6 times larger. The layer thickness dependency of the response time characteristics with polymer concentration 9wt% becames the same tendency as 5wt%. However, comparing with the case of 5wt%, the rise time increases and the decay time decreases.
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Keyword(in English) microwave / polymer dispersed nematic liquid crystal / response time performance / variation of layer thickness
Paper # ED2004-205,MW2004-212
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Conference Date 2005/1/10(1days)
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Language JPN
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Title (in English) Response time performances of polymer dispersed nematic liquid crystal for layer thickness
Sub Title (in English)
Keyword(1) microwave
Keyword(2) polymer dispersed nematic liquid crystal
Keyword(3) response time performance
Keyword(4) variation of layer thickness
1st Author's Name Katsuhiko SAITO
1st Author's Affiliation Department of Communications Engineering, National Defense Academy()
2nd Author's Name Toshihisa KAMEI
2nd Author's Affiliation Department of Communications Engineering, National Defense Academy
3rd Author's Name Hiroshi MORITAKE
3rd Author's Affiliation Department of Electrical and Electronic Engineering, National Defense Academy
4th Author's Name Yozo UTSUMI
4th Author's Affiliation Department of Communications Engineering, National Defense Academy
Date 2005-01-17
Paper # ED2004-205,MW2004-212
Volume (vol) vol.104
Number (no) 551
Page pp.pp.-
#Pages 4
Date of Issue