| Presentation | 2005-01-25 A Discussion on Fault Tolerance of Dynamic Reconfigurable Device Naoki OCHI, Kentaro NAKAHARA, Futoshi MORIE, Shinichi KOUYAMA, Tomonori IZUMI, Hiroyuki OCHI, Yukihiro NAKAMURA, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Reconfigurable logic devices are expected to be key devices for systems in severe environment such as spacecrafts, satellites, nuclear power plants and so on, since a system with such devices can be updated remotely by uploading new configuration data and, even for the case of physical defects, may be recovered by reconfiguration excluding faulty parts. However, in order to utilize reconfigurable devices in such a severe environment, we have to cope with logical defects of configuration data. Our goal is to enhance fault tolerance of dynamic reconfigurable systems especially to logical defects in configuration data. In this paper, we review previous works on fault tolerance of reconfigurable systems. Then, we discuss on frameworks of device architectures to enhance fault tolerance. We propose two types of architectures, one based on majority voting, and the other based on error-correcting codes. Both of them correct faults in configuration data autonomously utilizing the ability of dynamic reconfiguration. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Fault tolerance / Dynamic reconfigurable device / Single event upset(SEU) / Error correcotion / Multiplex |
| Paper # | VLD2004-101,CPSY2004-67 |
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| Committee | CPSY |
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| Conference Date | 2005/1/18(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Registration To | Computer Systems (CPSY) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Discussion on Fault Tolerance of Dynamic Reconfigurable Device |
| Sub Title (in English) | |
| Keyword(1) | Fault tolerance |
| Keyword(2) | Dynamic reconfigurable device |
| Keyword(3) | Single event upset(SEU) |
| Keyword(4) | Error correcotion |
| Keyword(5) | Multiplex |
| 1st Author's Name | Naoki OCHI |
| 1st Author's Affiliation | Department of Communications and Computer Engineering, Graduate School of Informatics, Kyoto University() |
| 2nd Author's Name | Kentaro NAKAHARA |
| 2nd Author's Affiliation | School of Electrical and Electronic Engineering, Faculty of Engineering, Kyoto University |
| 3rd Author's Name | Futoshi MORIE |
| 3rd Author's Affiliation | Department of Communications and Computer Engineering, Graduate School of Informatics, Kyoto University |
| 4th Author's Name | Shinichi KOUYAMA |
| 4th Author's Affiliation | Department of Communications and Computer Engineering, Graduate School of Informatics, Kyoto University |
| 5th Author's Name | Tomonori IZUMI |
| 5th Author's Affiliation | Department of Communications and Computer Engineering, Graduate School of Informatics, Kyoto University |
| 6th Author's Name | Hiroyuki OCHI |
| 6th Author's Affiliation | Department of Communications and Computer Engineering, Graduate School of Informatics, Kyoto University |
| 7th Author's Name | Yukihiro NAKAMURA |
| 7th Author's Affiliation | Department of Communications and Computer Engineering, Graduate School of Informatics, Kyoto University |
| Date | 2005-01-25 |
| Paper # | VLD2004-101,CPSY2004-67 |
| Volume (vol) | vol.104 |
| Number (no) | 591 |
| Page | pp.pp.- |
| #Pages | 6 |
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