| Presentation | 2005-01-21 Dielectric Measurement of Solid Lossy Dielectric Material Using Open-Ended Waveguide in Microwave Frequency Band Hidetoshi EBARA, Kensuke TANI, Daisuke MIKI, Teruo ONISHI, Shinji UEBAYASHI, Osamu HASHIMOTO, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | The aim of this study is to specify a nondestructive dielectric measurement method for a solid phantom, which is constructed to measure the Specific Absorption Rate (SAR). In this paper, dielectric measurement using an open-ended waveguide is adopted to measure the complex permittivity of a solid dielectric material with high conductivity. A numerical model representing the case where an open-ended waveguide is attached to the surface of the solid dielectric material is simulated using the FD-TD method. The complex reflection coefficient is calculated when varying the complex permittivity of the solid dielectric material. Charts of the relationship between the complex permittivity and the complex reflection coefficient are derived at 2 GHz and 5 GHz. The measured complex reflection coefficient is plotted on the charts. The results using this method are compared to the measurement results using the coaxial line method and the open-ended coaxial probe method. Additionally, this paper proposes a method using a low-loss dielectric material at the end of the waveguide for impedance matching with the solid dielectric material with high conductivity. As a result, the charts indicate that the complex reflection coefficient is drastically varied according to the change in the complex permittivity of the solid dielectric material. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | dielectric measurement / waveguide / solid phantom / FD-TD method / impedance matching |
| Paper # | EMCJ2004-134 |
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| Conference Information | |
| Committee | EMCJ |
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| Conference Date | 2005/1/14(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Electromagnetic Compatibility (EMCJ) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Dielectric Measurement of Solid Lossy Dielectric Material Using Open-Ended Waveguide in Microwave Frequency Band |
| Sub Title (in English) | |
| Keyword(1) | dielectric measurement |
| Keyword(2) | waveguide |
| Keyword(3) | solid phantom |
| Keyword(4) | FD-TD method |
| Keyword(5) | impedance matching |
| 1st Author's Name | Hidetoshi EBARA |
| 1st Author's Affiliation | NTT DoCoMo, Inc.() |
| 2nd Author's Name | Kensuke TANI |
| 2nd Author's Affiliation | Aoyama Gakuin University |
| 3rd Author's Name | Daisuke MIKI |
| 3rd Author's Affiliation | Aoyama Gakuin University |
| 4th Author's Name | Teruo ONISHI |
| 4th Author's Affiliation | NTT DoCoMo, Inc. |
| 5th Author's Name | Shinji UEBAYASHI |
| 5th Author's Affiliation | NTT DoCoMo, Inc. |
| 6th Author's Name | Osamu HASHIMOTO |
| 6th Author's Affiliation | Aoyama Gakuin University |
| Date | 2005-01-21 |
| Paper # | EMCJ2004-134 |
| Volume (vol) | vol.104 |
| Number (no) | 563 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |