Presentation 2005-06-28
A Scale Estimation Algorithm Based on Phase-Only Correlation for Electron Microscope Images
Sei NAGASHIMA, Takafumi AOKI, Ruriko TSUNETA,
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Abstract(in English) This paper presents a scale estimation algorithm based on Phase-Only Correlation (POC) for electron microscope images. The proposed method can estimate the scale factor and translational displacements between a reference image and an input image with high-accuracy. Significant improvement in scale estimation performance can be achieved by extracting a common region between the reference image and input image. Experimental evaluation using the Mandelbrot picture as a precisely scale-controlled image shows that the proposed method can estimate the scale factor in approximately 0.2[%]-scale accuracy, where the image size is 401×401[pixel], the scale factor is about 1000 and the scale is estimated with 16 stages (thus, the scale factor of each stage is about 1.54). This paper also describes an application of the proposed algorithm to magnification calibration for electron microscope images.
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Keyword(in English) phase-only correlation / scale estimation / mandelbrot picture / electron microscope
Paper # CAS2005-18,VLD2005-29,SIP2005-42
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Committee CAS
Conference Date 2005/6/21(1days)
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Registration To Circuits and Systems (CAS)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Scale Estimation Algorithm Based on Phase-Only Correlation for Electron Microscope Images
Sub Title (in English)
Keyword(1) phase-only correlation
Keyword(2) scale estimation
Keyword(3) mandelbrot picture
Keyword(4) electron microscope
1st Author's Name Sei NAGASHIMA
1st Author's Affiliation Graduate School of Information Sciences Tohoku University()
2nd Author's Name Takafumi AOKI
2nd Author's Affiliation Graduate School of Information Sciences Tohoku University
3rd Author's Name Ruriko TSUNETA
3rd Author's Affiliation Hitachi, Ltd., Central Research Laboratry
Date 2005-06-28
Paper # CAS2005-18,VLD2005-29,SIP2005-42
Volume (vol) vol.105
Number (no) 146
Page pp.pp.-
#Pages 6
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