Presentation 2005/6/23
Advanced Poly-Si TFT with Fin-Like Channels(Thin Film Devices and Systems)
Huaxiang Yin, Wenxu Xianyu, Hans Cho, Xiaoxin Zhang, Jisim Jung, Doyoung Kim, Hyuck Lim, Kyungbae Park, Jongman Kim, Jangyeon Kwon, Takashi Noguchi,
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Abstract(in English) The advanced LTPS TFT with 3-Dimensional channels of Fin-Like profile has been demonstrated via the simple Excimer Laser Annealing method and special wide undercut structure without any additional patterning process cost. This approach provides a much narrow Fin-Like channels in devices with high ratio of film thickness to the width and also a high quality poly-silicon film in channels such as smooth surface, tight grain arrangement and medium grain size etc. Due to the stronger electrical stress on the channel by the multi-gate effect and the better film in channel, the new device fabricated on the quartz substrate with Fin-Like channel structure show good characteristics of the highest mobility up to 395cm^2/V・sec, the sub-threshold voltage slope below 400mV/dec and the On-Off current ratio higher than 10^6.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Poly-Si / thin-film-transistors(TFTs) / 3-Dimensional(3D) / Fin / excimer laser annealing(ELA)
Paper # ED2005-101,SDM2005-121
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Conference Information
Committee ED
Conference Date 2005/6/23(1days)
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Paper Information
Registration To Electron Devices (ED)
Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Advanced Poly-Si TFT with Fin-Like Channels(Thin Film Devices and Systems)
Sub Title (in English)
Keyword(1) Poly-Si
Keyword(2) thin-film-transistors(TFTs)
Keyword(3) 3-Dimensional(3D)
Keyword(4) Fin
Keyword(5) excimer laser annealing(ELA)
1st Author's Name Huaxiang Yin
1st Author's Affiliation Samsung Advanced Institute of Technology, Kihung-Eup Yongin-Si()
2nd Author's Name Wenxu Xianyu
2nd Author's Affiliation Samsung Advanced Institute of Technology, Kihung-Eup Yongin-Si
3rd Author's Name Hans Cho
3rd Author's Affiliation Samsung Advanced Institute of Technology, Kihung-Eup Yongin-Si
4th Author's Name Xiaoxin Zhang
4th Author's Affiliation Samsung Advanced Institute of Technology, Kihung-Eup Yongin-Si
5th Author's Name Jisim Jung
5th Author's Affiliation Samsung Advanced Institute of Technology, Kihung-Eup Yongin-Si
6th Author's Name Doyoung Kim
6th Author's Affiliation Samsung Advanced Institute of Technology, Kihung-Eup Yongin-Si
7th Author's Name Hyuck Lim
7th Author's Affiliation Samsung Advanced Institute of Technology, Kihung-Eup Yongin-Si
8th Author's Name Kyungbae Park
8th Author's Affiliation Samsung Advanced Institute of Technology, Kihung-Eup Yongin-Si
9th Author's Name Jongman Kim
9th Author's Affiliation Samsung Advanced Institute of Technology, Kihung-Eup Yongin-Si
10th Author's Name Jangyeon Kwon
10th Author's Affiliation Samsung Advanced Institute of Technology, Kihung-Eup Yongin-Si
11th Author's Name Takashi Noguchi
11th Author's Affiliation Samsung Advanced Institute of Technology, Kihung-Eup Yongin-Si:Sungkyunkwan University
Date 2005/6/23
Paper # ED2005-101,SDM2005-121
Volume (vol) vol.105
Number (no) 154
Page pp.pp.-
#Pages 4
Date of Issue