Presentation 2005/6/21
Impact of High Performance Accumulation-Mode Fully Depleted SOI MOSFETs(Advanced Si Devices)
Weitao Cheng, Akinobu Teramoto, Masaki Hirayama, Shigetoshi Sugawa, Tadahiro Ohmi,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) This paper focuses attention on the improved device characteristics of Fully Depleted silicon on insulator (FD-SOI) MOSFETs on Si(100) surface by using normally-off Accumulation-mode device structure. We demonstrated that the current drivability of Accumulation-mode FD-SOI n-MOSFET on Si(100) is about 1.3 times larger than that of conventional Inversion-mode FD-SOI n-MOSFET and the current drivability of Accumulation-mode FD-SOI p-MOSFET is about 1.4 times larger than that of conventional Inversion-mode FD-SOI p-MOSFET. Furthermore, the influence of the impact ion phenomenon in Accumulation-Mode FD-SOI is slightly comparison with that of Inversion-Mode FD-SOI MOSFETs.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) FD-SOI / surface roughness / radical oxidation / Accumulation-mode / Inversion-mode
Paper # ED2005-80,SDM2005-100
Date of Issue

Conference Information
Committee ED
Conference Date 2005/6/21(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Electron Devices (ED)
Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Impact of High Performance Accumulation-Mode Fully Depleted SOI MOSFETs(Advanced Si Devices)
Sub Title (in English)
Keyword(1) FD-SOI
Keyword(2) surface roughness
Keyword(3) radical oxidation
Keyword(4) Accumulation-mode
Keyword(5) Inversion-mode
1st Author's Name Weitao Cheng
1st Author's Affiliation Graduate School of Engineering, Tohoku University()
2nd Author's Name Akinobu Teramoto
2nd Author's Affiliation New Industry Creation Hatchery Center, Tohoku University
3rd Author's Name Masaki Hirayama
3rd Author's Affiliation New Industry Creation Hatchery Center, Tohoku University
4th Author's Name Shigetoshi Sugawa
4th Author's Affiliation Graduate School of Engineering, Tohoku University
5th Author's Name Tadahiro Ohmi
5th Author's Affiliation New Industry Creation Hatchery Center, Tohoku University
Date 2005/6/21
Paper # ED2005-80,SDM2005-100
Volume (vol) vol.105
Number (no) 152
Page pp.pp.-
#Pages 4
Date of Issue