| Presentation | 2005/1/20 Numerical Examinations of Single-Electron Neural Devices : Temperature Characteristics on Competitive Neural Network Takahide OYA, Tetsuya ASAI, Ryo KAGAYA, Tetsuya HIROSE, Yoshihito AMEMIYA, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Information processing devices in the natural world ; e.g., our central nervous systems, can operate correctly under a noisy environment even though the unit elements are sensitive to noises. Recently many researchers have reported noise tolerance on neural networks. If we apply such tolerance of neural networks to single-electron circuits, we may design novel single-electron LSIs that have such tolerance for device failure or thermal noise. In this report, we propose a neuron circuit with a single-electron circuit, and a neural network with the circuit. We investigate noise and falut tolerance of the proposed network circuits by numerical simulations. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | single-electron circuit / competitive neural network / fault tolerance / noise tolerance |
| Paper # | ED2004-233,SDM2004-228 |
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| Conference Information | |
| Committee | ED |
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| Conference Date | 2005/1/20(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Paper Information | |
| Registration To | Electron Devices (ED) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Numerical Examinations of Single-Electron Neural Devices : Temperature Characteristics on Competitive Neural Network |
| Sub Title (in English) | |
| Keyword(1) | single-electron circuit |
| Keyword(2) | competitive neural network |
| Keyword(3) | fault tolerance |
| Keyword(4) | noise tolerance |
| 1st Author's Name | Takahide OYA |
| 1st Author's Affiliation | Graduate School of Information Science and Technology, Hokkaido University() |
| 2nd Author's Name | Tetsuya ASAI |
| 2nd Author's Affiliation | Graduate School of Information Science and Technology, Hokkaido University |
| 3rd Author's Name | Ryo KAGAYA |
| 3rd Author's Affiliation | Graduate School of Information Science and Technology, Hokkaido University |
| 4th Author's Name | Tetsuya HIROSE |
| 4th Author's Affiliation | Graduate School of Information Science and Technology, Hokkaido University |
| 5th Author's Name | Yoshihito AMEMIYA |
| 5th Author's Affiliation | Graduate School of Information Science and Technology, Hokkaido University |
| Date | 2005/1/20 |
| Paper # | ED2004-233,SDM2004-228 |
| Volume (vol) | vol.104 |
| Number (no) | 622 |
| Page | pp.pp.- |
| #Pages | 8 |
| Date of Issue | |