Presentation | 2005-01-27 Current challenges and the future of evaluation analysis technology of ULSI : The technology as a lifeline of LSI in the future Yoji Mashiko, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Current state of analysis-evaluation technology for ULSI devices is describes with some cases actually analyzed. And, the challenges of the analysis evaluation technology in the future progress of the ULSI devices is discussed. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | ULSI / analysis / evaluation / failure analysis / fault isolation / physical analysis |
Paper # | CPM2004-159,ICD2004-204 |
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Conference Information | |
Committee | CPM |
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Conference Date | 2005/1/20(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Registration To | Component Parts and Materials (CPM) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Current challenges and the future of evaluation analysis technology of ULSI : The technology as a lifeline of LSI in the future |
Sub Title (in English) | |
Keyword(1) | ULSI |
Keyword(2) | analysis |
Keyword(3) | evaluation |
Keyword(4) | failure analysis |
Keyword(5) | fault isolation |
Keyword(6) | physical analysis |
1st Author's Name | Yoji Mashiko |
1st Author's Affiliation | Production and Technology Unit, Renesas Technology Corp.() |
Date | 2005-01-27 |
Paper # | CPM2004-159,ICD2004-204 |
Volume (vol) | vol.104 |
Number (no) | 626 |
Page | pp.pp.- |
#Pages | 6 |
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