Presentation 2004/10/15
Influences of AlN buffer layer on AlGaN/GaN HEMTs on 4 inch Si substrates
Shinichi MATSUI, Kotaro YAMAMOTO, Hiroyasu ISHIKAWA, Takashi EGAWA,
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Abstract(in English) AlGaN/GaN HEMT structures were grown on 4 inch Si substrates by MOCVD method. We investigated the influences of AlN buffer layer thickness. The crystal quality and mobility were slightly improved when AlN buffer layer thickness was increased. However, when AlN buffer layer thickness was more than 200 nm, the mobility decreased due to cracks. We also investigated the influences of the number of pairs in GaN/AlN multilayers. The crystal quality improved and the mobility increased, with increasing the number of pairs in the multilayers. The sample which has 70-pair multilayers showed mobility of 1524.1 and 10958.3 cm^2/Vs at 300 and 77K, respectively.
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Keyword(in English) 4-inch / Si substrate / GaN / AlGaN/GaN / MOCVD / HEMT
Paper # ED2004-139,CPM2004-113,LQE2004-77
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Committee CPM
Conference Date 2004/10/15(1days)
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Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Influences of AlN buffer layer on AlGaN/GaN HEMTs on 4 inch Si substrates
Sub Title (in English)
Keyword(1) 4-inch
Keyword(2) Si substrate
Keyword(3) GaN
Keyword(4) AlGaN/GaN
Keyword(5) MOCVD
Keyword(6) HEMT
1st Author's Name Shinichi MATSUI
1st Author's Affiliation Research Center for Nano-Device and System, Nagoya Institute of Technology()
2nd Author's Name Kotaro YAMAMOTO
2nd Author's Affiliation Research Center for Nano-Device and System, Nagoya Institute of Technology
3rd Author's Name Hiroyasu ISHIKAWA
3rd Author's Affiliation Research Center for Nano-Device and System, Nagoya Institute of Technology
4th Author's Name Takashi EGAWA
4th Author's Affiliation Research Center for Nano-Device and System, Nagoya Institute of Technology
Date 2004/10/15
Paper # ED2004-139,CPM2004-113,LQE2004-77
Volume (vol) vol.104
Number (no) 360
Page pp.pp.-
#Pages 5
Date of Issue