Presentation 2004-10-22
Investigation of Multi-Bit Analog-to-Digital Converter
Yoshinori NISHIDO, Akito SEKIYA, Akira FUJIMAKI,
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Abstract(in English) We demonstrated the multi-bit analog-to-digital (A/D) converter by using our unique method which separated sigma-delta A/D modulator into a quantizer and some samplers. We confirmed correct operation of this A/D converter, and obtained signal-to-noise-ratio (SNR) of 25dB and spurious-free-dynamic-range (SFDR) of 54dB from only upper 7 bit outputs of this A/D converter. This performance is close to that from the simulation, so that we confirmed the effectiveness of this A/D converter. However some performance deterioration was observed, which was probably caused by external noise. Such deterioration became large when we measured upper 15 bit outputs of this A/D converter. We found the importance of improvement of our measuring system for measuring this A/D converter.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) analog-to-digital converter / multi-bit / sigma-delta / SFQ
Paper # SCE2004-29
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Conference Information
Committee SCE
Conference Date 2004/10/15(1days)
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Paper Information
Registration To Superconductive Electronics (SCE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Investigation of Multi-Bit Analog-to-Digital Converter
Sub Title (in English)
Keyword(1) analog-to-digital converter
Keyword(2) multi-bit
Keyword(3) sigma-delta
Keyword(4) SFQ
1st Author's Name Yoshinori NISHIDO
1st Author's Affiliation Dept. of Quantnum Engineering. Nagoya Univ.()
2nd Author's Name Akito SEKIYA
2nd Author's Affiliation Dept. of Information Electronics. Nagoya Univ.
3rd Author's Name Akira FUJIMAKI
3rd Author's Affiliation Dept. of Quantnum Engineering. Nagoya Univ.
Date 2004-10-22
Paper # SCE2004-29
Volume (vol) vol.104
Number (no) 373
Page pp.pp.-
#Pages 6
Date of Issue