| Presentation | 2005/6/10 A Probabilistic Model of Reseedings for Built-In Self-Testing : A Guideline for Selecting Test Methodologies Kiyoshi Furuya, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Reseedings, i.e. re-initializations of test pattern generation circuits, is often used for detecting RPR (Random Pattern Resistant) faults. This paper shows a probabilistic model of the reseedings to evaluate the efficiency and effective domain. It will be effective to determine an appropriate test technology for each objective circuit under test. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | BIST (Built-In Self Testing) / Random Testing / Reseeding / Random Pattern Resistant (RPR) Fault |
| Paper # | DC2005-9 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2005/6/10(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Vice Chair | |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Probabilistic Model of Reseedings for Built-In Self-Testing : A Guideline for Selecting Test Methodologies |
| Sub Title (in English) | |
| Keyword(1) | BIST (Built-In Self Testing) |
| Keyword(2) | Random Testing |
| Keyword(3) | Reseeding |
| Keyword(4) | Random Pattern Resistant (RPR) Fault |
| 1st Author's Name | Kiyoshi Furuya |
| 1st Author's Affiliation | Faculty of Science and Engineering, Chuo University() |
| Date | 2005/6/10 |
| Paper # | DC2005-9 |
| Volume (vol) | vol.105 |
| Number (no) | 123 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |