| Presentation | 2005/2/11 A Method for Diagnosing Multiple Fault Models based on Detecting/un-detecting Information Akane YAMASAKI, Tetsuya SEIYAMA, Hiroshi TAKAHASHI, Yoshinobu HIGAMI, Kouji YAMAZAKI, Yuzo TAKAMATSU, |
|---|---|
| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | With the scaling of LSI feature size and increasing complexity of LSI, it is difficult to determine the cause of failure in LSI. We also do not know which fault model can explain a behavior of the defect in the circuit under test before starting diagnosis. Moreover, under Built-In Self Test (BIST) environment, it is difficult to know which primary output has faulty response on the application of detecting test. Therefore, we propose an effective diagnostic method in the presence of unknown fault model, based on only detecting/un-detecting information on the applied tests. The proposed method diagnoses multiple fault models, such as single stuck-at, single bridging (AND, OR drive types), and single open faults. The proposed method deduces fault model that is able to explain the behavior of the defect in the circuit and locates faulty sites, based on the number of detections for single stuck-at faults at each lines, performing single stuck-at fault simulation with both detecting and un-detecting tests. To improve the ability of fault diagnosis, our method uses the logic values of lines and the condition whether the stuck-at faults at the lines are detected or not by detecting and un-detecting tests. Experimental results show that the proposed method can correctly identify the fault models for 90% faulty circuits. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | BIST / fault diagnosis / multiple fault models / detecting/un-detecting information |
| Paper # | DC2004-106 |
| Date of Issue |
| Conference Information | |
| Committee | DC |
|---|---|
| Conference Date | 2005/2/11(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Dependable Computing (DC) |
|---|---|
| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Method for Diagnosing Multiple Fault Models based on Detecting/un-detecting Information |
| Sub Title (in English) | |
| Keyword(1) | BIST |
| Keyword(2) | fault diagnosis |
| Keyword(3) | multiple fault models |
| Keyword(4) | detecting/un-detecting information |
| 1st Author's Name | Akane YAMASAKI |
| 1st Author's Affiliation | Graduate School of Science and Engineering, Ehime University() |
| 2nd Author's Name | Tetsuya SEIYAMA |
| 2nd Author's Affiliation | Graduate School of Science and Engineering, Ehime University |
| 3rd Author's Name | Hiroshi TAKAHASHI |
| 3rd Author's Affiliation | Dept. of Computer Science, Faculty of Engineering, Ehime University |
| 4th Author's Name | Yoshinobu HIGAMI |
| 4th Author's Affiliation | Dept. of Computer Science, Faculty of Engineering, Ehime University |
| 5th Author's Name | Kouji YAMAZAKI |
| 5th Author's Affiliation | School of Information and Communication, Meiji University |
| 6th Author's Name | Yuzo TAKAMATSU |
| 6th Author's Affiliation | Dept. of Computer Science, Faculty of Engineering, Ehime University |
| Date | 2005/2/11 |
| Paper # | DC2004-106 |
| Volume (vol) | vol.104 |
| Number (no) | 664 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |