Presentation 2005/2/11
A Method for Diagnosing Multiple Fault Models based on Detecting/un-detecting Information
Akane YAMASAKI, Tetsuya SEIYAMA, Hiroshi TAKAHASHI, Yoshinobu HIGAMI, Kouji YAMAZAKI, Yuzo TAKAMATSU,
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Abstract(in English) With the scaling of LSI feature size and increasing complexity of LSI, it is difficult to determine the cause of failure in LSI. We also do not know which fault model can explain a behavior of the defect in the circuit under test before starting diagnosis. Moreover, under Built-In Self Test (BIST) environment, it is difficult to know which primary output has faulty response on the application of detecting test. Therefore, we propose an effective diagnostic method in the presence of unknown fault model, based on only detecting/un-detecting information on the applied tests. The proposed method diagnoses multiple fault models, such as single stuck-at, single bridging (AND, OR drive types), and single open faults. The proposed method deduces fault model that is able to explain the behavior of the defect in the circuit and locates faulty sites, based on the number of detections for single stuck-at faults at each lines, performing single stuck-at fault simulation with both detecting and un-detecting tests. To improve the ability of fault diagnosis, our method uses the logic values of lines and the condition whether the stuck-at faults at the lines are detected or not by detecting and un-detecting tests. Experimental results show that the proposed method can correctly identify the fault models for 90% faulty circuits.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) BIST / fault diagnosis / multiple fault models / detecting/un-detecting information
Paper # DC2004-106
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Committee DC
Conference Date 2005/2/11(1days)
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Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Method for Diagnosing Multiple Fault Models based on Detecting/un-detecting Information
Sub Title (in English)
Keyword(1) BIST
Keyword(2) fault diagnosis
Keyword(3) multiple fault models
Keyword(4) detecting/un-detecting information
1st Author's Name Akane YAMASAKI
1st Author's Affiliation Graduate School of Science and Engineering, Ehime University()
2nd Author's Name Tetsuya SEIYAMA
2nd Author's Affiliation Graduate School of Science and Engineering, Ehime University
3rd Author's Name Hiroshi TAKAHASHI
3rd Author's Affiliation Dept. of Computer Science, Faculty of Engineering, Ehime University
4th Author's Name Yoshinobu HIGAMI
4th Author's Affiliation Dept. of Computer Science, Faculty of Engineering, Ehime University
5th Author's Name Kouji YAMAZAKI
5th Author's Affiliation School of Information and Communication, Meiji University
6th Author's Name Yuzo TAKAMATSU
6th Author's Affiliation Dept. of Computer Science, Faculty of Engineering, Ehime University
Date 2005/2/11
Paper # DC2004-106
Volume (vol) vol.104
Number (no) 664
Page pp.pp.-
#Pages 6
Date of Issue