Presentation 2005/2/11
Diagnosis for Open Faults by Using Erroneous Path Tracing Based on Detecting/Un-detecting Information
Koji YAMAZAKI, Yoshinobu HIGAMI, Hiroshi TAKAHASHI, Yuzo TAKAMATSU,
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Abstract(in English) With the increasing of circuit density, the importance of diagnosing open faults becomes larger. In recent years, built-in self test (BIST) is widely used to reduce test cost. Therefore, development of efficient fault diagnosis approach under BIST environment is much wanted. In this paper, we propose an approach to diagnose open faults based on detecting/un-detecting information. Experimental results for ISCAS'85 benchmark circuits show that the number of suspicious faults becomes less than 3 at most cases by using erroneous path tracing.
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Keyword(in English) Fault Diagnosis / Open Faults / Detecting/Un-detecting Information / Erroneous Path Tracing
Paper # DC2004-105
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Conference Date 2005/2/11(1days)
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Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Diagnosis for Open Faults by Using Erroneous Path Tracing Based on Detecting/Un-detecting Information
Sub Title (in English)
Keyword(1) Fault Diagnosis
Keyword(2) Open Faults
Keyword(3) Detecting/Un-detecting Information
Keyword(4) Erroneous Path Tracing
1st Author's Name Koji YAMAZAKI
1st Author's Affiliation School of Information and Communication, Meiji University()
2nd Author's Name Yoshinobu HIGAMI
2nd Author's Affiliation Faculty of Engineering, Ehime University
3rd Author's Name Hiroshi TAKAHASHI
3rd Author's Affiliation Faculty of Engineering, Ehime University
4th Author's Name Yuzo TAKAMATSU
4th Author's Affiliation Faculty of Engineering, Ehime University
Date 2005/2/11
Paper # DC2004-105
Volume (vol) vol.104
Number (no) 664
Page pp.pp.-
#Pages 6
Date of Issue