Presentation	2005/2/11 Research to Effectiveness of N-detection Test Sets for Fault Diagnosis Tsukasa ISHIGURO, Daisuke NAKAZATO, Koji YAMAZAKI, Toshinori HOSOKAWA,
PDF Download Page	PDF download Page Link
Abstract(in Japanese)	(See Japanese page)
Abstract(in English)	With the increasing of circuit size, problem of defects that cannot be detected by test sets for single stuck-at faults becomes larger. N-detection test are well known as an algorithm for easily generating high-quality test sets. In this paper, we evaluate the effectiveness of n-detection test sets and multiple primary output detection test sets (MPOD) to fault diagnosis. Furthermore, problems of MPOD are pointed out, and we propose an approach to overcome those problems.
Keyword(in Japanese)	(See Japanese page)
Keyword(in English)	n-detection test / fault diagnosis / stuck-at fault
Paper #	DC2004-104
Date of Issue

Conference Information
Committee	DC
Conference Date	2005/2/11(1days)
Place (in Japanese)	(See Japanese page)
Place (in English)
Topics (in Japanese)	(See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To	Dependable Computing (DC)
Language	JPN
Title (in Japanese)	(See Japanese page)
Sub Title (in Japanese)	(See Japanese page)
Title (in English)	Research to Effectiveness of N-detection Test Sets for Fault Diagnosis
Sub Title (in English)
Keyword(1)	n-detection test
Keyword(2)	fault diagnosis
Keyword(3)	stuck-at fault
1st Author's Name	Tsukasa ISHIGURO
1st Author's Affiliation	Meiji University()
2nd Author's Name	Daisuke NAKAZATO
2nd Author's Affiliation	System JD
3rd Author's Name	Koji YAMAZAKI
3rd Author's Affiliation	Meiji University
4th Author's Name	Toshinori HOSOKAWA
4th Author's Affiliation	Nihon University
Date	2005/2/11
Paper #	DC2004-104
Volume (vol)	vol.104
Number (no)	664
Page	pp.pp.-
#Pages	5
Date of Issue