Presentation 2005/2/11
Test Scheduling for Multi-clock Domain SoC with Power Constraints
Kimihiko MASUDA, Tomokazu YONEDA, Hideo FUJIWARA,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) We propose wrapper/TAM design and test scheduling algorithm to minimize test application time for multi-clock domain SoC that consists of cores with different operational frequency during test. In the proposed method, we consider the following constraints : the number of test pins and maximun available power consumption of a givenSoC, operational frequency of core during test, and operational frequency of ATE. We use TDM (Test Data Multiplexing) to solve the frequency gap between core and ATE. Moreover, we use TDM to reduce the power consumption of cores while keeping test time of the cores. Experimental results show the effectiveness of our method not only for multi-clock domain SoC, but also for single-clock domain SoCs with power constraints.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) multi-clock domain SoC / power consumption / test data multiplexing / test scheduling
Paper # DC2004-103
Date of Issue

Conference Information
Committee DC
Conference Date 2005/2/11(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Test Scheduling for Multi-clock Domain SoC with Power Constraints
Sub Title (in English)
Keyword(1) multi-clock domain SoC
Keyword(2) power consumption
Keyword(3) test data multiplexing
Keyword(4) test scheduling
1st Author's Name Kimihiko MASUDA
1st Author's Affiliation Nara Institute of Science and Technology()
2nd Author's Name Tomokazu YONEDA
2nd Author's Affiliation Nara Institute of Science and Technology
3rd Author's Name Hideo FUJIWARA
3rd Author's Affiliation Nara Institute of Science and Technology
Date 2005/2/11
Paper # DC2004-103
Volume (vol) vol.104
Number (no) 664
Page pp.pp.-
#Pages 6
Date of Issue