| Presentation | 2005/2/11 Diagnosis for Open Faults Based on Detecting/Un-detecting Information on Ambiguous Test Set Kiyoshi TAKECHI, Yuich SATO, Hiroshi TAKAHASHI, Yoshinobu HIGAMI, Kouji YAMAZAKI, Yuzo TAKAMATSU, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Development of BIST-based diagnosis for open faults is demanded because BIST is as effective in testing. Under BIST environment, it is difficult to know which primary output or scan flip-flop has faulty response on the application of a detecting test. Also it is difficult to identify the true detecting tests from the tests applied during BIST session. We have proposed the diagnostic method for single open fault, based on only detecting/un-detecting information on tests [22]. However we evaluate the effectiveness of our proposed method on the premise that the set of candidate detecting tests does not include un-detecting tests for the faulty circuit in [22]. Therefore, we consider whether our proposed method [22] is effective or not under the ambiguous test set. Experimental results show that the proposed method based on only detecting/un-detecting information [22] is able to diagnose single open faults under the ambiguous test set. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | BIST / fault diagnosis / ambiguous test set / detecting/un-detecting information / open faults |
| Paper # | DC2004-100 |
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| Committee | DC |
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| Conference Date | 2005/2/11(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Diagnosis for Open Faults Based on Detecting/Un-detecting Information on Ambiguous Test Set |
| Sub Title (in English) | |
| Keyword(1) | BIST |
| Keyword(2) | fault diagnosis |
| Keyword(3) | ambiguous test set |
| Keyword(4) | detecting/un-detecting information |
| Keyword(5) | open faults |
| 1st Author's Name | Kiyoshi TAKECHI |
| 1st Author's Affiliation | Graduate School of Science and Engineering, Ehime University() |
| 2nd Author's Name | Yuich SATO |
| 2nd Author's Affiliation | Graduate School of Science and Engineering, Ehime University |
| 3rd Author's Name | Hiroshi TAKAHASHI |
| 3rd Author's Affiliation | Dept. of Computer Science, Faculty of Engineering, Ehime University |
| 4th Author's Name | Yoshinobu HIGAMI |
| 4th Author's Affiliation | Dept. of Computer Science, Faculty of Engineering, Ehime University |
| 5th Author's Name | Kouji YAMAZAKI |
| 5th Author's Affiliation | School of Information and Communication, Meiji University |
| 6th Author's Name | Yuzo TAKAMATSU |
| 6th Author's Affiliation | Dept. of Computer Science, Faculty of Engineering, Ehime University |
| Date | 2005/2/11 |
| Paper # | DC2004-100 |
| Volume (vol) | vol.104 |
| Number (no) | 664 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |