| Presentation | 2005/2/11 Bridging Fault Diagnosis based on Detecting/Undetecting Information of Ambiguous Test Set Kazuki KURIYAMA, Takahiro NISHIYAMA, Yoshinobu HIGAMI, Kouji YAMAZAKI, Hiroshi TAKAHASHI, Yuzo TAKAMATSU, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Recently, LSI testing techniques under BIST environment has progressed, and it is desired to develop fault diagnosis methods using information obtained from BIST. In general, it is difficult to classify applied tests into detecting tests and undetecting tests, and then a test set including detecting tests adn undetecting tests may be obtained. In this article, we propose diagnosis methods using ambiguous test sets, where detecting test and undetecting tests are not classified completely. Moreover the methods use only detecting/undetecting information, which means they use no information on location of primary outputs where faulty effects are propagated. Target faults are bridging faults including AND-bridge, OR-bridge, drive faults. The proposed methods perform stuck-at fault simulation to obtain candidate faults. Also they partition given test sets into several groups. This sometimes allows to obtain candidate faults using a subset of tests, even if a large number of tests are given. Finally experimental results for benchmark circuits for evaluating the effectiveness of the methods. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | BIST / fault diagnosis / bridging faults / ambiguous test set / detecting/undetecting information |
| Paper # | DC2004-99 |
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| Committee | DC |
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| Conference Date | 2005/2/11(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Bridging Fault Diagnosis based on Detecting/Undetecting Information of Ambiguous Test Set |
| Sub Title (in English) | |
| Keyword(1) | BIST |
| Keyword(2) | fault diagnosis |
| Keyword(3) | bridging faults |
| Keyword(4) | ambiguous test set |
| Keyword(5) | detecting/undetecting information |
| 1st Author's Name | Kazuki KURIYAMA |
| 1st Author's Affiliation | Graduate School of Science and Engineering, Ehime University() |
| 2nd Author's Name | Takahiro NISHIYAMA |
| 2nd Author's Affiliation | Graduate School of Science and Engineering, Ehime University |
| 3rd Author's Name | Yoshinobu HIGAMI |
| 3rd Author's Affiliation | Dept. of Computer Science, Faculty of Engineering, Ehime University |
| 4th Author's Name | Kouji YAMAZAKI |
| 4th Author's Affiliation | School of Information and Communication, Meiji University |
| 5th Author's Name | Hiroshi TAKAHASHI |
| 5th Author's Affiliation | Dept. of Computer Science, Faculty of Engineering, Ehime University |
| 6th Author's Name | Yuzo TAKAMATSU |
| 6th Author's Affiliation | Dept. of Computer Science, Faculty of Engineering, Ehime University |
| Date | 2005/2/11 |
| Paper # | DC2004-99 |
| Volume (vol) | vol.104 |
| Number (no) | 664 |
| Page | pp.pp.- |
| #Pages | 5 |
| Date of Issue | |