Presentation 2005/2/11
1 Multiple Primary Output Detection Test Pattern Generation
Daisuke NAKAZATO, Toshinori HOSOKAWA, Koji YAMAZAKI, Tsukasa ISHIGURO, Hiroshi DATE,
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Abstract(in English) n-detection test set are known as one of efficient test sets. However, many tests which hardly contribute to improvement in test quality may be contained in test sets generated base on conventional definitions. Then, the further improvement in test quality becomes possible by using the test set to which more signal lines are activated. In this paper, we propose the activation coverage. It paid attention to the number of activated signal lines, as a new evalucation measure of test quality. In addition, we propose Multiple Primary Outputs Detection Test Pattern Generation (MPOD) for improvement of activation coverage. Experiment results show that the improvement of the activation coverage is reflected in the improvement of the test quality andthe effectiveness of the test set generated with MPOD.
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Keyword(in English) n-detection test / stuck at fault / bridge fault / delay fault / ATPG / test quality / fault observation coverage / activation coverage
Paper # DC2004-95
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Committee DC
Conference Date 2005/2/11(1days)
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Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) 1 Multiple Primary Output Detection Test Pattern Generation
Sub Title (in English)
Keyword(1) n-detection test
Keyword(2) stuck at fault
Keyword(3) bridge fault
Keyword(4) delay fault
Keyword(5) ATPG
Keyword(6) test quality
Keyword(7) fault observation coverage
Keyword(8) activation coverage
1st Author's Name Daisuke NAKAZATO
1st Author's Affiliation System JD CO., Ltd()
2nd Author's Name Toshinori HOSOKAWA
2nd Author's Affiliation College of Industrial Technology, Nihon University
3rd Author's Name Koji YAMAZAKI
3rd Author's Affiliation College of Information and Communication, Meiji University
4th Author's Name Tsukasa ISHIGURO
4th Author's Affiliation School of Science and Technology, Meiji University
5th Author's Name Hiroshi DATE
5th Author's Affiliation System JD CO., Ltd
Date 2005/2/11
Paper # DC2004-95
Volume (vol) vol.104
Number (no) 664
Page pp.pp.-
#Pages 6
Date of Issue