| Presentation | 2005/2/11 A Functional Test Method for State-Observable Incompletely Specified FSMs Toshinori HOSOKAWA, Hideo FUJIWARA, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | It is well known that state-observable and completely specified FSMs are functionally tested completely by performing all state transitions. However, practically FSMs may be incompletely specified. This paper proposes two test methods, a fault independent functional test method and a fault dependent test generation method, for state-observable FSMs that may be incompletely specified. The fault dependent test generation is based on a single pattern test for logical fault model and a two pattern test for timing fault model. Experimental results for MCNC'91 benchmark circuits show that the use of our method reduces the average area by 13.2% while the state transition coverage is increased 4.3 times by using only 29.4% additional test sequences compared with the conventional non-scan test method for FSMs. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | State observable / Incompletely specified FSMs / Constrained ATPG / Over testing / Fault dependent test generation / Fault independent functional test / State transition coverage |
| Paper # | DC2004-93 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2005/2/11(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Functional Test Method for State-Observable Incompletely Specified FSMs |
| Sub Title (in English) | |
| Keyword(1) | State observable |
| Keyword(2) | Incompletely specified FSMs |
| Keyword(3) | Constrained ATPG |
| Keyword(4) | Over testing |
| Keyword(5) | Fault dependent test generation |
| Keyword(6) | Fault independent functional test |
| Keyword(7) | State transition coverage |
| 1st Author's Name | Toshinori HOSOKAWA |
| 1st Author's Affiliation | College of Industrial Technology, Nihon University() |
| 2nd Author's Name | Hideo FUJIWARA |
| 2nd Author's Affiliation | Graduate School of Information Science, Nara Institute of Science and Technology(NAIST) |
| Date | 2005/2/11 |
| Paper # | DC2004-93 |
| Volume (vol) | vol.104 |
| Number (no) | 664 |
| Page | pp.pp.- |
| #Pages | 7 |
| Date of Issue | |