Presentation 2004/11/25
Bridging Fault Diagnosis Using Ambiguous Test Set
Takahiro NISHIYAMA, Yoshinobu HIGAMI, Kouji YAMASAKI, Hiroshi TAKAHASHI, Yuzo TAKAMATSU,
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Abstract(in English) Fault diagnosis under BIST environment is more difficult because highly compacted signatures make it difficult to obtain the information necessary for diagnosis. Therefore the failing test set that is identified in BIST session includes accidentally non-failing tests. We call the test set that includes failing tests and non-failing tests an "ambiguous detecting test set". In this paper, we propose a method for diagnosing bridging faults assuming that an ambiguous detecting test set and non-failing tests are given.
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Keyword(in English) fault diagnosis / BIST / bridging fault
Paper # VLD2004-70,ICD2004-156,DC2004-56
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Committee DC
Conference Date 2004/11/25(1days)
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Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Bridging Fault Diagnosis Using Ambiguous Test Set
Sub Title (in English)
Keyword(1) fault diagnosis
Keyword(2) BIST
Keyword(3) bridging fault
1st Author's Name Takahiro NISHIYAMA
1st Author's Affiliation Graduate School of Science and Engineering, Ehime University()
2nd Author's Name Yoshinobu HIGAMI
2nd Author's Affiliation Dept. of Computer Science, Faculty of Engineering, Ehime University
3rd Author's Name Kouji YAMASAKI
3rd Author's Affiliation School of Information and Communication, Meiji University
4th Author's Name Hiroshi TAKAHASHI
4th Author's Affiliation Dept. of Computer Science, Faculty of Engineering, Ehime University
5th Author's Name Yuzo TAKAMATSU
5th Author's Affiliation Dept. of Computer Science, Faculty of Engineering, Ehime University
Date 2004/11/25
Paper # VLD2004-70,ICD2004-156,DC2004-56
Volume (vol) vol.104
Number (no) 482
Page pp.pp.-
#Pages 6
Date of Issue