| Presentation | 2004/11/24 Semiconductor testing system survey on technological trends of patent applications : fiscal year 2003 Patent Office Electrical Components Processing Div. Third Patent Examination Dept. Japan, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | It is very important to consider both strategies, R&D and intellectual property from the global viewpoint, relating to semiconductor testing system which leads price competitiveness. We mainly investigated patent database and analyzed trends in markets, technological development and international competitiveness, and forecasts in the field of semiconductor testing system. We will report the investigation result. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | semiconductor testing system / intellectual property / patent application / technological trend |
| Paper # | VLD2004-58,ICD2004-144,DC2004-44,CPSY2004-29 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2004/11/24(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Semiconductor testing system survey on technological trends of patent applications : fiscal year 2003 |
| Sub Title (in English) | |
| Keyword(1) | semiconductor testing system |
| Keyword(2) | intellectual property |
| Keyword(3) | patent application |
| Keyword(4) | technological trend |
| 1st Author's Name | Patent Office Electrical Components Processing Div. Third Patent Examination Dept. Japan |
| 1st Author's Affiliation | () |
| Date | 2004/11/24 |
| Paper # | VLD2004-58,ICD2004-144,DC2004-44,CPSY2004-29 |
| Volume (vol) | vol.104 |
| Number (no) | 481 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |