Presentation 2004/11/24
A Cost-effective Technique to Mitigate Soft Errors in Logic Circuits
Luong D. HUNG, Masanori TAKADA, Yi GE, Shuichi SAKAI,
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Abstract(in English) The soft error rates (SER) in logic circuits increase quickly as devices scale. Existing techniques to mitigate soft errors hi logic circuits often incur large overheads. In this work, we propose a 'lightweight' technique that detects soft errors in logic circuits, utilizing the concept of temporal sampling. The technique adds some modifications to the conventional pipeline to allow data to be sampled twice in time and compared for integrity. The area, power, and tuning overheads of modifying a 32-bit multiplier to support the technique are respectively 19.3%, 7.6%, and 6.4%. Comparing to existing soft error detection circuit techniques, our technique incurs lower overheads. The technique is also applicable in scaled process technologies.
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Keyword(in English) Soft error / SER / logic circuit / pipeline / flip flop
Paper # VLD2004-54,ICD2004-140,DC2004-40
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Conference Date 2004/11/24(1days)
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Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Cost-effective Technique to Mitigate Soft Errors in Logic Circuits
Sub Title (in English)
Keyword(1) Soft error
Keyword(2) SER
Keyword(3) logic circuit
Keyword(4) pipeline
Keyword(5) flip flop
1st Author's Name Luong D. HUNG
1st Author's Affiliation Graduate School of Information Science and Technology, The University of Tokyo()
2nd Author's Name Masanori TAKADA
2nd Author's Affiliation Graduate School of Information Science and Technology, The University of Tokyo
3rd Author's Name Yi GE
3rd Author's Affiliation Graduate School of Information Science and Technology, The University of Tokyo
4th Author's Name Shuichi SAKAI
4th Author's Affiliation Graduate School of Information Science and Technology, The University of Tokyo
Date 2004/11/24
Paper # VLD2004-54,ICD2004-140,DC2004-40
Volume (vol) vol.104
Number (no) 481
Page pp.pp.-
#Pages 6
Date of Issue