Presentation 2005-05-13
Wideband Magnetooptic Probe with High Spatial Resolution and Its Application to High Density Packaging Technology
Mizuki IWANAMI, Shigeki HOSHINO, Norio MASUDA, Masato KISHI, Masahiro TSUCHIYA,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) A microscopic magnetic field probe has been proposed, which is one of fiber optic field sensors but employs a magnetooptic crystal glued at a fiber edge. Basic characteristics of its performances and effectiveness in its practical usage have been investigated so far. In this paper, some basic performances of the probe are shown with some examples of its applications to high density packaging technology of integrated circuits. Particularly, focused are on visualization of GHz-range magnetic field over μm-order fine circuits and searches of undesired electromagnetic emission (electromagnetic interference) sources in LSI-mounted boards and so on.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Fiber-Edge Magnetooptic Probe / High Spatial Resolution / Wide Bandwidth / Resonant Cavity Structure / Fine Circuit / GHz-Range Magnetic Field Map / Electromagnetic Interference Source Investigation
Paper # OFT2005-15
Date of Issue

Conference Information
Committee OFT
Conference Date 2005/5/5(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Optical Fiber Technology (OFT)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Wideband Magnetooptic Probe with High Spatial Resolution and Its Application to High Density Packaging Technology
Sub Title (in English)
Keyword(1) Fiber-Edge Magnetooptic Probe
Keyword(2) High Spatial Resolution
Keyword(3) Wide Bandwidth
Keyword(4) Resonant Cavity Structure
Keyword(5) Fine Circuit
Keyword(6) GHz-Range Magnetic Field Map
Keyword(7) Electromagnetic Interference Source Investigation
1st Author's Name Mizuki IWANAMI
1st Author's Affiliation NEC Corporation()
2nd Author's Name Shigeki HOSHINO
2nd Author's Affiliation NEC Corporation
3rd Author's Name Norio MASUDA
3rd Author's Affiliation NEC Corporation
4th Author's Name Masato KISHI
4th Author's Affiliation Department of Electronic Engineering, the University of Tokyo
5th Author's Name Masahiro TSUCHIYA
5th Author's Affiliation National Institute of Information and Communications Technology
Date 2005-05-13
Paper # OFT2005-15
Volume (vol) vol.105
Number (no) 38
Page pp.pp.-
#Pages 6
Date of Issue