Presentation 1999/2/5
Free Volume in polysilane films measured by a positron annihilation lifetime spectroscopy
T. Kasai, F. Hori, R. Oshime, K. Oka, T. Dohmaru,
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Abstract(in English) A positron annihilation lifetime spectroscopy is a powerful method which allows us to obtain information concerning the free volume spaces in materials. By means of this experimental method, we measured the sizes of free volume spaces in polysilanes under various conditions. It was found that the sizes of free volume spaces in polysilane films strongly depended on the conditions where those films were prepared.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) polysilane / positron / orientation / molecular-weight dependence / thermochromism
Paper # OEM98-122
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Committee OME
Conference Date 1999/2/5(1days)
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Paper Information
Registration To Organic Material Electronics (OME)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Free Volume in polysilane films measured by a positron annihilation lifetime spectroscopy
Sub Title (in English)
Keyword(1) polysilane
Keyword(2) positron
Keyword(3) orientation
Keyword(4) molecular-weight dependence
Keyword(5) thermochromism
1st Author's Name T. Kasai
1st Author's Affiliation Research Institute for Advanced Science and Technology, Osaka Prefecture University()
2nd Author's Name F. Hori
2nd Author's Affiliation Research Institute for Advanced Science and Technology, Osaka Prefecture University
3rd Author's Name R. Oshime
3rd Author's Affiliation Research Institute for Advanced Science and Technology, Osaka Prefecture University
4th Author's Name K. Oka
4th Author's Affiliation Research Institute for Advanced Science and Technology, Osaka Prefecture University
5th Author's Name T. Dohmaru
5th Author's Affiliation Research Institute for Advanced Science and Technology, Osaka Prefecture University
Date 1999/2/5
Paper # OEM98-122
Volume (vol) vol.98
Number (no) 580
Page pp.pp.-
#Pages 6
Date of Issue