Presentation 1994/5/19
Electron Distribution Analysis of C(diamond),Si,Ge,Fe_3O_4 etc. Using Uotra-short Wavelength X-rays
P.Okamura F, Yukino K, Yamamoto K, Ohshima K, Kino Y,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) A novel experimental system for high resolution analysis of electron distribution was developed and applied suessfully for the cases of C(diamond), Si, Ge, Fe_3o_4 etc.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) electron distribution / high resolution / diamond / Si / Ge / magnetite
Paper # CPM94-7
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Conference Information
Committee CPM
Conference Date 1994/5/19(1days)
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Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Electron Distribution Analysis of C(diamond),Si,Ge,Fe_3O_4 etc. Using Uotra-short Wavelength X-rays
Sub Title (in English)
Keyword(1) electron distribution
Keyword(2) high resolution
Keyword(3) diamond
Keyword(4) Si
Keyword(5) Ge
Keyword(6) magnetite
1st Author's Name P.Okamura F
1st Author's Affiliation NIRIM()
2nd Author's Name Yukino K
2nd Author's Affiliation NIRIM
3rd Author's Name Yamamoto K
3rd Author's Affiliation University of Tsukuba
4th Author's Name Ohshima K
4th Author's Affiliation University of Tsukuba
5th Author's Name Kino Y
5th Author's Affiliation Rigaku Co.
Date 1994/5/19
Paper # CPM94-7
Volume (vol) vol.94
Number (no) 39
Page pp.pp.-
#Pages 7
Date of Issue