Presentation 1994/5/19
X-ray fluorescence analysis using high energy X-rays. -X-rya fluorescence analysisi for heavy atoms using W-shite X-ray exited by highly applied voltage.
Takahashi Y, Yamamoto K, Ohsima K, P.Okamura F,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) We have obtained the X-ray fluorescent spectra from heavy atoms using W-white rays excited with highly applied voltage at the NIRIM. The present reports shows more important information on a series of K-lines of spectra in heavy atoms.
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Keyword(in English) fluorescence / lanthanoids / energy dispergive spectrometer / solid state ditector / multi channel analyser
Paper # CPM94-3
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Committee CPM
Conference Date 1994/5/19(1days)
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Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) X-ray fluorescence analysis using high energy X-rays. -X-rya fluorescence analysisi for heavy atoms using W-shite X-ray exited by highly applied voltage.
Sub Title (in English)
Keyword(1) fluorescence
Keyword(2) lanthanoids
Keyword(3) energy dispergive spectrometer
Keyword(4) solid state ditector
Keyword(5) multi channel analyser
1st Author's Name Takahashi Y
1st Author's Affiliation University of Tsukuba()
2nd Author's Name Yamamoto K
2nd Author's Affiliation University of Tsukuba
3rd Author's Name Ohsima K
3rd Author's Affiliation University of Tsukuba
4th Author's Name P.Okamura F
4th Author's Affiliation NIRIM
Date 1994/5/19
Paper # CPM94-3
Volume (vol) vol.94
Number (no) 39
Page pp.pp.-
#Pages 2
Date of Issue