Presentation 2001/8/17
A Built-In Self-Repair Analyzer(CRESTA)for embedded DRAMs
Mitsutaka Niiro, Tomoya Kawagoe, Jun Ohtani, Masanao Maruta, Tukasa Ooishi, Mitsuhiro Hamada, Hideto Hidaka,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) A new practical built-in self-repair analyzer algorithm for embedded DRAMs(eDRAM)achieves 100% detection ability of the repairable chips with l% area penalty of the target 32Mb embedded DRAM by 4 parallel analyzers. It works at as fast as 500MHz, well beyond targeted eDRAMs' maximum operation speed around 200MHz_+.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) BISA / Real Time Analysis / CRESTA / Redundancy Test / embedded DRAM / Repair Algorithm
Paper # ICD2001-67
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Conference Date 2001/8/17(1days)
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Paper Information
Registration To Integrated Circuits and Devices (ICD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Built-In Self-Repair Analyzer(CRESTA)for embedded DRAMs
Sub Title (in English)
Keyword(1) BISA
Keyword(2) Real Time Analysis
Keyword(3) CRESTA
Keyword(4) Redundancy Test
Keyword(5) embedded DRAM
Keyword(6) Repair Algorithm
1st Author's Name Mitsutaka Niiro
1st Author's Affiliation Mitsubishi Electric Corp., ULSI Development Center()
2nd Author's Name Tomoya Kawagoe
2nd Author's Affiliation Mitsubishi Electric Corp., ULSI Development Center
3rd Author's Name Jun Ohtani
3rd Author's Affiliation Mitsubishi Electric Corp., ULSI Development Center
4th Author's Name Masanao Maruta
4th Author's Affiliation Mitsubishi Electric Corp., ULSI Development Center
5th Author's Name Tukasa Ooishi
5th Author's Affiliation Mitsubishi Electric Corp., ULSI Development Center
6th Author's Name Mitsuhiro Hamada
6th Author's Affiliation Mitsubishi Electric Corp., Manufacturing Technology & Production Management Div.
7th Author's Name Hideto Hidaka
7th Author's Affiliation Mitsubishi Electric Corp., ULSI Development Center
Date 2001/8/17
Paper # ICD2001-67
Volume (vol) vol.101
Number (no) 266
Page pp.pp.-
#Pages 8
Date of Issue