Presentation 2000/6/30
Development of Scanning Displacement Current Microscopy
Atsushi Okuda, Setsuri Uehara, Tomohiko Masuda, Yutaka Majima, Mitsumasa Iwamoto,
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Abstract(in English) We have developed a scanning displacement current microscopy (SDM) which measures the displacement current image induced by changes in capacitance between a probe and sample. In the developed SDM, displacement current image and tunneling current image can be measured simultaneously. It is possible to characterize semiconductor impurity dopant profile absolutely. In this report, we show a successful SDM image of a grating sample, and analyze the resolution of the displacement current image.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Scanning Probe Microscopy / displacement current / tunneling current / dopant profile
Paper # US2000-25,EMD2000-21,CPM2000-36,OME2000-31
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Committee OME
Conference Date 2000/6/30(1days)
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Registration To Organic Material Electronics (OME)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Development of Scanning Displacement Current Microscopy
Sub Title (in English)
Keyword(1) Scanning Probe Microscopy
Keyword(2) displacement current
Keyword(3) tunneling current
Keyword(4) dopant profile
1st Author's Name Atsushi Okuda
1st Author's Affiliation Department of Physical Electronics, Tokyo Institute of Technology()
2nd Author's Name Setsuri Uehara
2nd Author's Affiliation Department of Physical Electronics, Tokyo Institute of Technology
3rd Author's Name Tomohiko Masuda
3rd Author's Affiliation Department of Physical Electronics, Tokyo Institute of Technology
4th Author's Name Yutaka Majima
4th Author's Affiliation Department of Physical Electronics, Tokyo Institute of Technology
5th Author's Name Mitsumasa Iwamoto
5th Author's Affiliation Department of Physical Electronics, Tokyo Institute of Technology
Date 2000/6/30
Paper # US2000-25,EMD2000-21,CPM2000-36,OME2000-31
Volume (vol) vol.100
Number (no) 167
Page pp.pp.-
#Pages 6
Date of Issue