| Presentation | 1999/5/21 Evaluation of Evanescent Fields on Al Thin Film/LB Thin Film Caused by Resonantly Excited Surface Plasmons Takayuki Nakano, Hajime Kobayashi, Futao Kaneko, Kazunari Shinbo, Keizo Kato, Takahiro Kawakami, Takashi Wakamatsu, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In this study, evanescent fields on Al thin film or LB thin films on Al thin films caused by resonantly excited surface plasmons (SPs) were evaluated by measuring fluorescent light from a metal needle probe covered with CdS scattering the fields. The attenuated total reflection (ATR) properties were measured for the Al thin film and a dip in the ATR curve was observed at the resonant incident angle of 43.6°. The fluorescent light, that is, the evanescent fields were measured as a function of the incident angle of the laser beam exciting the SPs and as a function of the distance from the surface. The results showed that the intensity was biggest at a lower angle than the resonant angle, and that the intensity decayed exponentially with the distance. It was also observed that the intensities of the fields generating near the LB films on the Al film decreased with numbers of the LB monolayer. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Surface plasmon / Evanescent field / LB film / ATR method |
| Paper # | OME99-18 |
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| Conference Information | |
| Committee | OME |
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| Conference Date | 1999/5/21(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Paper Information | |
| Registration To | Organic Material Electronics (OME) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Evaluation of Evanescent Fields on Al Thin Film/LB Thin Film Caused by Resonantly Excited Surface Plasmons |
| Sub Title (in English) | |
| Keyword(1) | Surface plasmon |
| Keyword(2) | Evanescent field |
| Keyword(3) | LB film |
| Keyword(4) | ATR method |
| 1st Author's Name | Takayuki Nakano |
| 1st Author's Affiliation | Department of Electrical and Electronic Engineering, Niigata University() |
| 2nd Author's Name | Hajime Kobayashi |
| 2nd Author's Affiliation | Department of Electrical and Electronic Engineering, Niigata University |
| 3rd Author's Name | Futao Kaneko |
| 3rd Author's Affiliation | Department of Electrical and Electronic Engineering, Niigata University |
| 4th Author's Name | Kazunari Shinbo |
| 4th Author's Affiliation | Department of Electrical and Electronic Engineering, Niigata University |
| 5th Author's Name | Keizo Kato |
| 5th Author's Affiliation | Department of Electrical and Electronic Engineering, Niigata University |
| 6th Author's Name | Takahiro Kawakami |
| 6th Author's Affiliation | Department of Electrical and Electronic Engineering, Niigata University |
| 7th Author's Name | Takashi Wakamatsu |
| 7th Author's Affiliation | Department of Electrical Engineering, Ibaraki National College of Technology |
| Date | 1999/5/21 |
| Paper # | OME99-18 |
| Volume (vol) | vol.99 |
| Number (no) | 79 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |