Presentation 1998/10/23
Nanometer-scale Imaging of Electrical Features in Organic Thin Films by Scanning Maxwell-stress Microscopy
Hoon-Kyu Shin, Hiroshi Yokoyama,
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Abstract(in English) The scanning Maxwell-stress microscopy (SMM) is a dynamic noncontact electric force microscopy that allows simultaneous access to the electrical properties of molecular system such as surface potential, surface charge, dielectric constant and conductivity along with the topography. Here we report our recent results of its application to nanoscopic study of domain structures and electrical functionality in organic thin films prepared by the Langmuir-Blodgett technique and spin coating.
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Keyword(in English) Scanning Maxwell-stress microscopy / Organic thin films / Ion complex / Surface potential
Paper # OME98-100
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Conference Information
Committee OME
Conference Date 1998/10/23(1days)
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Registration To Organic Material Electronics (OME)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Nanometer-scale Imaging of Electrical Features in Organic Thin Films by Scanning Maxwell-stress Microscopy
Sub Title (in English)
Keyword(1) Scanning Maxwell-stress microscopy
Keyword(2) Organic thin films
Keyword(3) Ion complex
Keyword(4) Surface potential
1st Author's Name Hoon-Kyu Shin
1st Author's Affiliation Supermolecular Science Division, Electrotechnical Laboratory()
2nd Author's Name Hiroshi Yokoyama
2nd Author's Affiliation Supermolecular Science Division, Electrotechnical Laboratory
Date 1998/10/23
Paper # OME98-100
Volume (vol) vol.98
Number (no) 363
Page pp.pp.-
#Pages 7
Date of Issue