Presentation | 1998/10/23 Nanometer-scale Imaging of Electrical Features in Organic Thin Films by Scanning Maxwell-stress Microscopy Hoon-Kyu Shin, Hiroshi Yokoyama, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | The scanning Maxwell-stress microscopy (SMM) is a dynamic noncontact electric force microscopy that allows simultaneous access to the electrical properties of molecular system such as surface potential, surface charge, dielectric constant and conductivity along with the topography. Here we report our recent results of its application to nanoscopic study of domain structures and electrical functionality in organic thin films prepared by the Langmuir-Blodgett technique and spin coating. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Scanning Maxwell-stress microscopy / Organic thin films / Ion complex / Surface potential |
Paper # | OME98-100 |
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Committee | OME |
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Conference Date | 1998/10/23(1days) |
Place (in Japanese) | (See Japanese page) |
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Registration To | Organic Material Electronics (OME) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Nanometer-scale Imaging of Electrical Features in Organic Thin Films by Scanning Maxwell-stress Microscopy |
Sub Title (in English) | |
Keyword(1) | Scanning Maxwell-stress microscopy |
Keyword(2) | Organic thin films |
Keyword(3) | Ion complex |
Keyword(4) | Surface potential |
1st Author's Name | Hoon-Kyu Shin |
1st Author's Affiliation | Supermolecular Science Division, Electrotechnical Laboratory() |
2nd Author's Name | Hiroshi Yokoyama |
2nd Author's Affiliation | Supermolecular Science Division, Electrotechnical Laboratory |
Date | 1998/10/23 |
Paper # | OME98-100 |
Volume (vol) | vol.98 |
Number (no) | 363 |
Page | pp.pp.- |
#Pages | 7 |
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