Presentation | 1998/9/14 STM light emission spectroscopy Y. Uehara, S. Ushioda, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Several applications of the STM light emission spectroscopy in nanometer-scale characterization of surface materials are reviewed. When electrons(holes)are injected from the tip of a STM to a sample surface, visible light is emitted. Since the beam diameter of electrons from the STM tip is narrower than ~1 nm and moreover the beam energy is very low, one can obtain the light emission spectra of individual nanometer-scale structures without modifying them. By correlating the spectra with the size and shape of the structure, materials information about nanometer-scale individual structures can be obtained. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | STM / light emission / spectroscopy / surface analysis |
Paper # | OME98-81 |
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Conference Information | |
Committee | OME |
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Conference Date | 1998/9/14(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Organic Material Electronics (OME) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | STM light emission spectroscopy |
Sub Title (in English) | |
Keyword(1) | STM |
Keyword(2) | light emission |
Keyword(3) | spectroscopy |
Keyword(4) | surface analysis |
1st Author's Name | Y. Uehara |
1st Author's Affiliation | Research Institute of Electrical Communication, Tohoku University() |
2nd Author's Name | S. Ushioda |
2nd Author's Affiliation | Research Institute of Electrical Communication, Tohoku University |
Date | 1998/9/14 |
Paper # | OME98-81 |
Volume (vol) | vol.98 |
Number (no) | 267 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |