Presentation 1998/9/14
STM light emission spectroscopy
Y. Uehara, S. Ushioda,
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Abstract(in English) Several applications of the STM light emission spectroscopy in nanometer-scale characterization of surface materials are reviewed. When electrons(holes)are injected from the tip of a STM to a sample surface, visible light is emitted. Since the beam diameter of electrons from the STM tip is narrower than ~1 nm and moreover the beam energy is very low, one can obtain the light emission spectra of individual nanometer-scale structures without modifying them. By correlating the spectra with the size and shape of the structure, materials information about nanometer-scale individual structures can be obtained.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) STM / light emission / spectroscopy / surface analysis
Paper # OME98-81
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Conference Information
Committee OME
Conference Date 1998/9/14(1days)
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Registration To Organic Material Electronics (OME)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) STM light emission spectroscopy
Sub Title (in English)
Keyword(1) STM
Keyword(2) light emission
Keyword(3) spectroscopy
Keyword(4) surface analysis
1st Author's Name Y. Uehara
1st Author's Affiliation Research Institute of Electrical Communication, Tohoku University()
2nd Author's Name S. Ushioda
2nd Author's Affiliation Research Institute of Electrical Communication, Tohoku University
Date 1998/9/14
Paper # OME98-81
Volume (vol) vol.98
Number (no) 267
Page pp.pp.-
#Pages 6
Date of Issue