Presentation | 1998/9/14 Improvement of energy resolution of Laplace transformation method for measuring localized-state distribution in disordered semiconductors N. Ogawa, H. Naito, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | A method has been proposed for the improvement of energy resolution of the Laplace transformation(LT) method based on the analysis of transient photoconductivity in disordered semi-conductors. Energy resolution is improved by about 0.5kT in comparison with that of the LT method. This improved method, LT method and modulated photocurrent method are applied to the analysis of computer-generated transient photoconductivity and the improved method can most successfully reproduce the localized-state distributions. In case of exponential distributions, the improved method correctly works even when the characteristic temperature of the exponential distributions is smaller than the measurement temperature. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | localized-state distribution / Laplace transform method / numerical Laplace transform method / modulated photocurrent method / energy resolution |
Paper # | OME98-73 |
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Committee | OME |
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Conference Date | 1998/9/14(1days) |
Place (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Organic Material Electronics (OME) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Improvement of energy resolution of Laplace transformation method for measuring localized-state distribution in disordered semiconductors |
Sub Title (in English) | |
Keyword(1) | localized-state distribution |
Keyword(2) | Laplace transform method |
Keyword(3) | numerical Laplace transform method |
Keyword(4) | modulated photocurrent method |
Keyword(5) | energy resolution |
1st Author's Name | N. Ogawa |
1st Author's Affiliation | Department of Physics and Electronics, Osaka Prefecture University() |
2nd Author's Name | H. Naito |
2nd Author's Affiliation | Department of Physics and Electronics, Osaka Prefecture University |
Date | 1998/9/14 |
Paper # | OME98-73 |
Volume (vol) | vol.98 |
Number (no) | 267 |
Page | pp.pp.- |
#Pages | 8 |
Date of Issue |