Presentation 1998/5/29
Effect of purity and impurity gasses of evaporated perylene derivative films on FET properties
Takeshi SUGA, Masaaki IIZUKA, Shigekazu KUNIYOSHI, Kazuhiro KUDO, Kuniaki TANAKA,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) We have fabricated perylene derivative(PTCDI)evaporated films which are known as n-type organic semiconductors and carried out in-situ field effect(FET)measurements. Non-purified and purified PTCDI materials obtained by sublimation technique were classified to those which showed FET properties or not. From the FET measurements, PTCDI films fabricated here indicated n-type semiconducting properties, and conductivity, carrier mobility and carrier concentration were obtained. Furthermore, these electrical parameters were strongly influenced by the purity itself and oxygen gas. Experimental results by changing the substrate temperature and thermal annealing revealed that FET properties were lost by the introduction of oxygen gas and they were recovered by the thermal annealing in the vacuum.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) n-type organic semiconductor / perylene / in-situ FET measurement / purification by a sublimation technique / carrier mobility / conductivity
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Committee OME
Conference Date 1998/5/29(1days)
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Registration To Organic Material Electronics (OME)
Language JPN
Title (in Japanese) (See Japanese page)
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Title (in English) Effect of purity and impurity gasses of evaporated perylene derivative films on FET properties
Sub Title (in English)
Keyword(1) n-type organic semiconductor
Keyword(2) perylene
Keyword(3) in-situ FET measurement
Keyword(4) purification by a sublimation technique
Keyword(5) carrier mobility
Keyword(6) conductivity
1st Author's Name Takeshi SUGA
1st Author's Affiliation Department of Electronics and Mechanical Engineering, Chiba University()
2nd Author's Name Masaaki IIZUKA
2nd Author's Affiliation Department of Electronics and Mechanical Engineering, Chiba University
3rd Author's Name Shigekazu KUNIYOSHI
3rd Author's Affiliation Department of Electronics and Mechanical Engineering, Chiba University
4th Author's Name Kazuhiro KUDO
4th Author's Affiliation Department of Electronics and Mechanical Engineering, Chiba University
5th Author's Name Kuniaki TANAKA
5th Author's Affiliation Department of Electronics and Mechanical Engineering, Chiba University
Date 1998/5/29
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Volume (vol) vol.98
Number (no) 92
Page pp.pp.-
#Pages 6
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