| Presentation | 1998/5/29 Tunneling Current and Surface Potential Simultaneous Measuring System using a Scanning Probe Yutaka MAJIMA, Shin-ichiro MIYAMOTO, Yutaka OYAMA, Mitsumasa IWAMOTO, |
|---|---|
| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | A new simultaneous measuring system for tunneling current and surface potential has been developed. An electrochemically etched tungsten tip is used as a probe electrode. The distance (d) between a sample and the tip is changed sinusoidally with high precision. The tunneling current flows periodically in accordance with the vibration of the tip when d becomes as small as a few nm. The surface potential is measured using the principle of the Kelvin method in which the displacement current due to the presence surface potential and change in capacitance difference between the tip and the sample is detected. Simultaneous measurement of the tunneling current and the displacement current has been attained by utilizing their phase difference of a vibration of the tip. The method for determining the tip peak radius and d is also presented. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | tunneling current / Kelvin method / scanning probe / Maxwell displacement current / scanning tunneling spectroscopy |
| Paper # | |
| Date of Issue |
| Conference Information | |
| Committee | OME |
|---|---|
| Conference Date | 1998/5/29(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Organic Material Electronics (OME) |
|---|---|
| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Tunneling Current and Surface Potential Simultaneous Measuring System using a Scanning Probe |
| Sub Title (in English) | |
| Keyword(1) | tunneling current |
| Keyword(2) | Kelvin method |
| Keyword(3) | scanning probe |
| Keyword(4) | Maxwell displacement current |
| Keyword(5) | scanning tunneling spectroscopy |
| 1st Author's Name | Yutaka MAJIMA |
| 1st Author's Affiliation | Department of Physical Electronics, Tokyo Institute of Technology() |
| 2nd Author's Name | Shin-ichiro MIYAMOTO |
| 2nd Author's Affiliation | Department of Physical Electronics, Tokyo Institute of Technology |
| 3rd Author's Name | Yutaka OYAMA |
| 3rd Author's Affiliation | Department of Physical Electronics, Tokyo Institute of Technology |
| 4th Author's Name | Mitsumasa IWAMOTO |
| 4th Author's Affiliation | Department of Physical Electronics, Tokyo Institute of Technology |
| Date | 1998/5/29 |
| Paper # | |
| Volume (vol) | vol.98 |
| Number (no) | 92 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |