| Presentation | 1998/5/29 Patterned Polypyrrole Complex of Contact Probe for High Density Printed Wiring Boards Yosuke ITAGAKI, Masaharu SATOH, Hajime KUZUMI, |
|---|---|
| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | A contact probes for an error analysis of high density printed wiring boards utilizing a conducting polypyrrole complex have been prepared with the direct polymerization of pyrrole in a photosensitive resin matrix. The cylindrically formed complexes with 80μm diameter and 200μm high demonstrates the sufficiently low resistance of 200kΩ. Furthermore, they show the reversible deformation with compressed stress up to 20% of the initial length. These results indicate that the patterned polypyrrole complex should be useful as the probes for the high density printed wiring boards. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Conducting polymer / Polypyrrole / Contact pin / High density printed wiring board |
| Paper # | |
| Date of Issue |
| Conference Information | |
| Committee | OME |
|---|---|
| Conference Date | 1998/5/29(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Organic Material Electronics (OME) |
|---|---|
| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Patterned Polypyrrole Complex of Contact Probe for High Density Printed Wiring Boards |
| Sub Title (in English) | |
| Keyword(1) | Conducting polymer |
| Keyword(2) | Polypyrrole |
| Keyword(3) | Contact pin |
| Keyword(4) | High density printed wiring board |
| 1st Author's Name | Yosuke ITAGAKI |
| 1st Author's Affiliation | Analysis and Evaluation Technology Center., NEC Corporation() |
| 2nd Author's Name | Masaharu SATOH |
| 2nd Author's Affiliation | Functional Devices Res. Labs., NEC Corporation |
| 3rd Author's Name | Hajime KUZUMI |
| 3rd Author's Affiliation | Analysis and Evaluation Technology Center., NEC Corporation |
| Date | 1998/5/29 |
| Paper # | |
| Volume (vol) | vol.98 |
| Number (no) | 92 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |