Presentation | 1995/7/26 Structural Evaluation of Organic EL Thin Films by TXRD and AFM Kenji Orita, Kouichi Hayashi, Toshihisa Horiuchi, Kazumi Matsushige, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | A total reflection X-ray diffractometer (TXRD) was employed to reveal first and conclusively the crystalization of organic materials for organic electroluminescent(EL) diodes during an annealing process. Morphological changes were evaluated by Atomic force microscpopy (AFM). Examined here were TPD, Alq_3 and TPD/Alq_3 films vacuum-deposited on SiO_2 glass substrates. During annealing, a single-layered sample of TPD changed amorphous to crystalline, while that of Alq_3 remained amorphous structure. In the case of the double-layered sample, however, the upper Alq_3 layer changed to crystalline as well as the underneath TPD one. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Organic EL / TPD / Alq_3 / Structural cahnge / TXRD / AFM |
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Conference Information | |
Committee | OME |
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Conference Date | 1995/7/26(1days) |
Place (in Japanese) | (See Japanese page) |
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Registration To | Organic Material Electronics (OME) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Structural Evaluation of Organic EL Thin Films by TXRD and AFM |
Sub Title (in English) | |
Keyword(1) | Organic EL |
Keyword(2) | TPD |
Keyword(3) | Alq_3 |
Keyword(4) | Structural cahnge |
Keyword(5) | TXRD |
Keyword(6) | AFM |
1st Author's Name | Kenji Orita |
1st Author's Affiliation | Department of Electronics Science and Engineering, Faculty of Engineering, Kyoto University() |
2nd Author's Name | Kouichi Hayashi |
2nd Author's Affiliation | Department of Electronics Science and Engineering, Faculty of Engineering, Kyoto University |
3rd Author's Name | Toshihisa Horiuchi |
3rd Author's Affiliation | Department of Electronics Science and Engineering, Faculty of Engineering, Kyoto University |
4th Author's Name | Kazumi Matsushige |
4th Author's Affiliation | Department of Electronics Science and Engineering, Faculty of Engineering, Kyoto University |
Date | 1995/7/26 |
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Volume (vol) | vol.95 |
Number (no) | 187 |
Page | pp.pp.- |
#Pages | 5 |
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