Presentation 1995/7/26
Structural Evaluation of Organic EL Thin Films by TXRD and AFM
Kenji Orita, Kouichi Hayashi, Toshihisa Horiuchi, Kazumi Matsushige,
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Abstract(in English) A total reflection X-ray diffractometer (TXRD) was employed to reveal first and conclusively the crystalization of organic materials for organic electroluminescent(EL) diodes during an annealing process. Morphological changes were evaluated by Atomic force microscpopy (AFM). Examined here were TPD, Alq_3 and TPD/Alq_3 films vacuum-deposited on SiO_2 glass substrates. During annealing, a single-layered sample of TPD changed amorphous to crystalline, while that of Alq_3 remained amorphous structure. In the case of the double-layered sample, however, the upper Alq_3 layer changed to crystalline as well as the underneath TPD one.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Organic EL / TPD / Alq_3 / Structural cahnge / TXRD / AFM
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Committee OME
Conference Date 1995/7/26(1days)
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Registration To Organic Material Electronics (OME)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Structural Evaluation of Organic EL Thin Films by TXRD and AFM
Sub Title (in English)
Keyword(1) Organic EL
Keyword(2) TPD
Keyword(3) Alq_3
Keyword(4) Structural cahnge
Keyword(5) TXRD
Keyword(6) AFM
1st Author's Name Kenji Orita
1st Author's Affiliation Department of Electronics Science and Engineering, Faculty of Engineering, Kyoto University()
2nd Author's Name Kouichi Hayashi
2nd Author's Affiliation Department of Electronics Science and Engineering, Faculty of Engineering, Kyoto University
3rd Author's Name Toshihisa Horiuchi
3rd Author's Affiliation Department of Electronics Science and Engineering, Faculty of Engineering, Kyoto University
4th Author's Name Kazumi Matsushige
4th Author's Affiliation Department of Electronics Science and Engineering, Faculty of Engineering, Kyoto University
Date 1995/7/26
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Volume (vol) vol.95
Number (no) 187
Page pp.pp.-
#Pages 5
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