Presentation 1996/7/25
Local area characterization of organic ultra thin films using scanning probe microscope
Katsumi OZAWA, Shigekazu KUNIYOSHI, Kazuhiro KUDO, Kuniaki TANAKA,
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Abstract(in English) Scanning probe microscope can be applied to measure not only the surface topography but also the local area characterization of organic ultra thin films. Scanning tunneling spectoroscopy (STS) is a useful method to get the local density of states of the sample. Tunneling spectra will change using a semiconductor tip and inelastic electron tunneling spectroscopy (IETS) using scanning tunneling microscope (STM) will provide the electronic states and molecular vibrational mode. We report its basic results and application to high density recording system.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) scanning probe microscope / STM / STS / inelastic electron tunneling spectroscopy
Paper # OME96-40
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Committee OME
Conference Date 1996/7/25(1days)
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Registration To Organic Material Electronics (OME)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Local area characterization of organic ultra thin films using scanning probe microscope
Sub Title (in English)
Keyword(1) scanning probe microscope
Keyword(2) STM
Keyword(3) STS
Keyword(4) inelastic electron tunneling spectroscopy
1st Author's Name Katsumi OZAWA
1st Author's Affiliation Department of Electrical and Electronics Engineering, Chiba University()
2nd Author's Name Shigekazu KUNIYOSHI
2nd Author's Affiliation Department of Electrical and Electronics Engineering, Chiba University
3rd Author's Name Kazuhiro KUDO
3rd Author's Affiliation Department of Electrical and Electronics Engineering, Chiba University
4th Author's Name Kuniaki TANAKA
4th Author's Affiliation Department of Electrical and Electronics Engineering, Chiba University
Date 1996/7/25
Paper # OME96-40
Volume (vol) vol.96
Number (no) 195
Page pp.pp.-
#Pages 6
Date of Issue