Presentation | 2002/9/24 Investigation of Equivalent Circuit Model of ESD Protection Devices Hiromi ANZAI, Yosiharu TOSAKA, Kunihiro SUZUKI, Hideki OKA, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | It is difficult to keep ESD (ElectroStatic Discharge) immunity of protection devices. We study ESD immunity using circuit simulations. We investigate an equivalent circuit model of ESD protection devices, which represents the gate vias dependence of the snapback characteristics. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | ESD / Circuit Simulation / Protection Circuit / Protection Device / Snapback Characteristic / Equivalent Circuit Model |
Paper # | VLD2002-77 |
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Conference Information | |
Committee | VLD |
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Conference Date | 2002/9/24(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | VLSI Design Technologies (VLD) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Investigation of Equivalent Circuit Model of ESD Protection Devices |
Sub Title (in English) | |
Keyword(1) | ESD |
Keyword(2) | Circuit Simulation |
Keyword(3) | Protection Circuit |
Keyword(4) | Protection Device |
Keyword(5) | Snapback Characteristic |
Keyword(6) | Equivalent Circuit Model |
1st Author's Name | Hiromi ANZAI |
1st Author's Affiliation | Fujitsu Laboratories Ltd.() |
2nd Author's Name | Yosiharu TOSAKA |
2nd Author's Affiliation | Fujitsu Laboratories Ltd. |
3rd Author's Name | Kunihiro SUZUKI |
3rd Author's Affiliation | Fujitsu Laboratories Ltd. |
4th Author's Name | Hideki OKA |
4th Author's Affiliation | Fujitsu Laboratories Ltd. |
Date | 2002/9/24 |
Paper # | VLD2002-77 |
Volume (vol) | vol.102 |
Number (no) | 345 |
Page | pp.pp.- |
#Pages | 5 |
Date of Issue |