Presentation 2001/11/22
Test Data Compression Using Don't-Care Identification and Statistical Encoding
Kenjiro Taniguchi, Seiji Kajiwara, Pomeranz Irith, M.Reddy Sudhakar,
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Abstract(in English) This paper describes a method of test data compression for a given test set using statistical encoding. In order to maximize the effectiveness of statistical encoding, the methods first convert to some input values of test vectors to unspecified values without losing fault coverage, and then reassign appropriate logic values to the unspecified inputs. Experimental results for ISCAS-89 benchmark circuit show the proposed method could reduce test data volume to less than 40% of the original test sets.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) test data compression / don't-care identification / statistical encoding / Huffman's alogorithm / SoC testing
Paper # VLD2001-97,ICD2001-142,FTS2001-44
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Committee VLD
Conference Date 2001/11/22(1days)
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Registration To VLSI Design Technologies (VLD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Test Data Compression Using Don't-Care Identification and Statistical Encoding
Sub Title (in English)
Keyword(1) test data compression
Keyword(2) don't-care identification
Keyword(3) statistical encoding
Keyword(4) Huffman's alogorithm
Keyword(5) SoC testing
1st Author's Name Kenjiro Taniguchi
1st Author's Affiliation Department of Computer Sciences and Electronics Kyushu Institute of Technology()
2nd Author's Name Seiji Kajiwara
2nd Author's Affiliation Department of Computer Sciences and Electronics Kyushu Institute of Technology
3rd Author's Name Pomeranz Irith
3rd Author's Affiliation School of Electrical and Computer Engineering, Purdue University
4th Author's Name M.Reddy Sudhakar
4th Author's Affiliation Electrical and Computer Engineering Department, University of Iowa
Date 2001/11/22
Paper # VLD2001-97,ICD2001-142,FTS2001-44
Volume (vol) vol.101
Number (no) 467
Page pp.pp.-
#Pages 5
Date of Issue