Presentation 2000/9/14
Characterization of Interconnect Coupling Noise using In-situ Delay-Change Curve Measurements
Takashi Sato, Yu Cao, Dennis Sylvester, Chenming Hu,
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Abstract(in English) The delay-change curve(DCC)characterizes the variation of the interconnect delay due to coupling noise. This paper describes a set of novel models that relate the DCC to the coupling noise waveform. These models are targeted for use in the noise-aware static timing analysis, timing margin desidn and accurate experimental detemination of sub-nanosecond coupling noise. The circuit structure, a set of measurements, the model equations, and the waveform extraction procedures are newly proposed. Evaluation results using a 0.25-μm test chip are presented showing good agreement with SPICE simulations.
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Keyword(in English) Crosstalk noise / Delay Change Curve(DCC) / Timing analysis
Paper # VLD2000-49,SDM2000-122
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Committee VLD
Conference Date 2000/9/14(1days)
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Registration To VLSI Design Technologies (VLD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Characterization of Interconnect Coupling Noise using In-situ Delay-Change Curve Measurements
Sub Title (in English)
Keyword(1) Crosstalk noise
Keyword(2) Delay Change Curve(DCC)
Keyword(3) Timing analysis
1st Author's Name Takashi Sato
1st Author's Affiliation Semiconductor & Integrated Circuits, Hitachi, Ltd.()
2nd Author's Name Yu Cao
2nd Author's Affiliation University of California, Berkeley
3rd Author's Name Dennis Sylvester
3rd Author's Affiliation University of Michigan, Ann Arbor.
4th Author's Name Chenming Hu
4th Author's Affiliation University of California, Berkeley
Date 2000/9/14
Paper # VLD2000-49,SDM2000-122
Volume (vol) vol.100
Number (no) 293
Page pp.pp.-
#Pages 10
Date of Issue