Presentation | 1998/10/23 Device-Size Dependence of Current Fluctuation Simulation under Ultra-Small Device Structures Yoshiyuki Kitahara, Nobuyuki Sano, Kenji Natori, Mikio Mukai, Kazuya Matsuzawa, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | The current fluctuation is investigated under ultra-small device structures via Monte Carlo method. It is found that a new current noise mode characteristic to ultra-small devices appears, in which the transition of the diffusive to the quasi-ballistic electron transport occurs. This current noise is caused dominantly by the high-energy electrons in the drain edge which are injected quasi-ballistically from the channel and are "kicked-back"into the channel by scatterings. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Ultra-small device structure / Current fluctuation / Quasi-ballistic transport / Monte Carlo / Shot-noise / Thermal-noise |
Paper # | VLD98-93,ED98-118,SDM98-154,ICD98-224 |
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Conference Information | |
Committee | VLD |
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Conference Date | 1998/10/23(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | VLSI Design Technologies (VLD) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Device-Size Dependence of Current Fluctuation Simulation under Ultra-Small Device Structures |
Sub Title (in English) | |
Keyword(1) | Ultra-small device structure |
Keyword(2) | Current fluctuation |
Keyword(3) | Quasi-ballistic transport |
Keyword(4) | Monte Carlo |
Keyword(5) | Shot-noise |
Keyword(6) | Thermal-noise |
1st Author's Name | Yoshiyuki Kitahara |
1st Author's Affiliation | Institute of Applied Physics University of Tsukuba() |
2nd Author's Name | Nobuyuki Sano |
2nd Author's Affiliation | Institute of Applied Physics University of Tsukuba |
3rd Author's Name | Kenji Natori |
3rd Author's Affiliation | Institute of Applied Physics University of Tsukuba |
4th Author's Name | Mikio Mukai |
4th Author's Affiliation | Semiconductor Technology Academic Research Center(STARC) |
5th Author's Name | Kazuya Matsuzawa |
5th Author's Affiliation | Semiconductor Technology Academic Research Center(STARC) |
Date | 1998/10/23 |
Paper # | VLD98-93,ED98-118,SDM98-154,ICD98-224 |
Volume (vol) | vol.98 |
Number (no) | 346 |
Page | pp.pp.- |
#Pages | 8 |
Date of Issue |