Presentation 1998/10/23
Device-Size Dependence of Current Fluctuation Simulation under Ultra-Small Device Structures
Yoshiyuki Kitahara, Nobuyuki Sano, Kenji Natori, Mikio Mukai, Kazuya Matsuzawa,
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Abstract(in English) The current fluctuation is investigated under ultra-small device structures via Monte Carlo method. It is found that a new current noise mode characteristic to ultra-small devices appears, in which the transition of the diffusive to the quasi-ballistic electron transport occurs. This current noise is caused dominantly by the high-energy electrons in the drain edge which are injected quasi-ballistically from the channel and are "kicked-back"into the channel by scatterings.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Ultra-small device structure / Current fluctuation / Quasi-ballistic transport / Monte Carlo / Shot-noise / Thermal-noise
Paper # VLD98-93,ED98-118,SDM98-154,ICD98-224
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Conference Information
Committee VLD
Conference Date 1998/10/23(1days)
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Registration To VLSI Design Technologies (VLD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Device-Size Dependence of Current Fluctuation Simulation under Ultra-Small Device Structures
Sub Title (in English)
Keyword(1) Ultra-small device structure
Keyword(2) Current fluctuation
Keyword(3) Quasi-ballistic transport
Keyword(4) Monte Carlo
Keyword(5) Shot-noise
Keyword(6) Thermal-noise
1st Author's Name Yoshiyuki Kitahara
1st Author's Affiliation Institute of Applied Physics University of Tsukuba()
2nd Author's Name Nobuyuki Sano
2nd Author's Affiliation Institute of Applied Physics University of Tsukuba
3rd Author's Name Kenji Natori
3rd Author's Affiliation Institute of Applied Physics University of Tsukuba
4th Author's Name Mikio Mukai
4th Author's Affiliation Semiconductor Technology Academic Research Center(STARC)
5th Author's Name Kazuya Matsuzawa
5th Author's Affiliation Semiconductor Technology Academic Research Center(STARC)
Date 1998/10/23
Paper # VLD98-93,ED98-118,SDM98-154,ICD98-224
Volume (vol) vol.98
Number (no) 346
Page pp.pp.-
#Pages 8
Date of Issue