Presentation 1995/10/20
Optimization of Sequential Circuits using Retiming and Redundancy Removal
Hiroyuki Yotsuyanagi, Seiji Kajihara, Kozo Kinoshita,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) The existence of sequential redundancy in logic circuits will have bad effects on chip size and testability of sequential circuits. In this paper we propose a redundancy removal method for reducing the number of gates and flip-flops. The proposed method is comprised of redundancy removal using a combinational test generator and retiming. Retiming is utilized for two purposes: One is for finding sequential redundancies and another is for reducing the number of flip-flops. Applying redundancy removal techniques after retiming, not only all combinational redundancies but also several sequential redundancies can be removed. Experimental results for ISCAS'89 benchmark circuits show that this method can remove many sequential redundancies and reduce the number of gates and flip-flops.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Sequential logic optimization / retiming / fault detection / redundancy removal / stuck-at faults
Paper # VLD95-94,FTS95-56
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Committee VLD
Conference Date 1995/10/20(1days)
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Registration To VLSI Design Technologies (VLD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Optimization of Sequential Circuits using Retiming and Redundancy Removal
Sub Title (in English)
Keyword(1) Sequential logic optimization
Keyword(2) retiming
Keyword(3) fault detection
Keyword(4) redundancy removal
Keyword(5) stuck-at faults
1st Author's Name Hiroyuki Yotsuyanagi
1st Author's Affiliation Department of Applied Physics, Faculty of Engineering, Osaka University()
2nd Author's Name Seiji Kajihara
2nd Author's Affiliation Department of Applied Physics, Faculty of Engineering, Osaka University
3rd Author's Name Kozo Kinoshita
3rd Author's Affiliation Department of Applied Physics, Faculty of Engineering, Osaka University
Date 1995/10/20
Paper # VLD95-94,FTS95-56
Volume (vol) vol.95
Number (no) 307
Page pp.pp.-
#Pages 8
Date of Issue