| Presentation | 1995/9/14 Crosstalk Noise Considering Inductive Coupling in VLSI Interconnections in Heterogeneous Insulators T. Mido, K. Asada, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | We estimate a value of crosstalk noise in VLSI Interconnections considering inductive coupling. It is necessary to treat long interconnections as lines with parasitic inductance and parasitic capacitance, when signal delay time of the line is much larger than signal raising time. We tried to estimate crosstalk noise of several cm interconnections as an example. We found out pulse noise only on the condition that the lines are in heterogeneous insulators - Lower dielectric materials are in the gaps of lines -. And on the condition that lines become longer, the signal raising time becomes faster and dielectric constant of materials in the gaps on lines becomes smaller, the pulse noise becomes predominant noise factor. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Crosstalk Noise / VLSI Interconnections / Inductive Coupling / Capacitive Coupling / Heterogeneous Insulators |
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| Conference Information | |
| Committee | VLD |
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| Conference Date | 1995/9/14(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Registration To | VLSI Design Technologies (VLD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Crosstalk Noise Considering Inductive Coupling in VLSI Interconnections in Heterogeneous Insulators |
| Sub Title (in English) | |
| Keyword(1) | Crosstalk Noise |
| Keyword(2) | VLSI Interconnections |
| Keyword(3) | Inductive Coupling |
| Keyword(4) | Capacitive Coupling |
| Keyword(5) | Heterogeneous Insulators |
| 1st Author's Name | T. Mido |
| 1st Author's Affiliation | Department of Electronic Engineering, University of Tokyo() |
| 2nd Author's Name | K. Asada |
| 2nd Author's Affiliation | Department of Electronic Engineering, University of Tokyo |
| Date | 1995/9/14 |
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| Volume (vol) | vol.95 |
| Number (no) | 231 |
| Page | pp.pp.- |
| #Pages | 6 |
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