| Presentation | 1997/10/29 Masking Double Faults in Combinational Circuits Using Retry Scheme and Hamming Code Takeo YOSHIDA, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Alternate-Data Retry (ADR) is one of fault tolerant techniques using both retry scheme and error-detecting code. This paper presents a method using tries at most two times (initial try and retry) and parity check code to mask a single fault in combinational circuits. We also propose a method using tries at most two times and Hamming code to correct multiple errors caused by double faults in combinational circuits. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | ADR / retry / parity check code / Hamming code / error correction / fault masking |
| Paper # | VLD97-82 |
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| Conference Information | |
| Committee | VLD |
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| Conference Date | 1997/10/29(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Vice Chair | |
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| Paper Information | |
| Registration To | VLSI Design Technologies (VLD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Masking Double Faults in Combinational Circuits Using Retry Scheme and Hamming Code |
| Sub Title (in English) | |
| Keyword(1) | ADR |
| Keyword(2) | retry |
| Keyword(3) | parity check code |
| Keyword(4) | Hamming code |
| Keyword(5) | error correction |
| Keyword(6) | fault masking |
| 1st Author's Name | Takeo YOSHIDA |
| 1st Author's Affiliation | Department of Information Engineering, Faculty of Engineering, University of the Ryukyus() |
| Date | 1997/10/29 |
| Paper # | VLD97-82 |
| Volume (vol) | vol.97 |
| Number (no) | 344 |
| Page | pp.pp.- |
| #Pages | 8 |
| Date of Issue | |