Presentation 1996/9/27
Simulator for Cosmic Ray Neutron Induced Soft Errors and Its Applications
Yoshiharu Tosaka, Shigeo Satoh, Toru Itakura,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) To clarify the cosmic ray neutron-induced soft errors, we developed a simulator to model neutron-induced charge collection. Our simulator has a nuclear reaction database which is based on the Antisymmetrized Molecular Dynamics simulation results. We demonstrated good agreement with neutron-induced charge collection experiments. We then simulated the neutron-induced soft errors in a 0.35μm CMOS SRAM and Latch circuit and showed the significant large contribution of the neutron effects to soft errors.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) cosmic ray / neutron / soft errors / neutron-induced charge collection simulator / Antisymmetrized Molecular Dynamics / SRAM / Latch
Paper # VLD96-46,ED96-92,SDM96-102
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Conference Information
Committee VLD
Conference Date 1996/9/27(1days)
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Registration To VLSI Design Technologies (VLD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Simulator for Cosmic Ray Neutron Induced Soft Errors and Its Applications
Sub Title (in English)
Keyword(1) cosmic ray
Keyword(2) neutron
Keyword(3) soft errors
Keyword(4) neutron-induced charge collection simulator
Keyword(5) Antisymmetrized Molecular Dynamics
Keyword(6) SRAM
Keyword(7) Latch
1st Author's Name Yoshiharu Tosaka
1st Author's Affiliation Fujitsu Laboratories Ltd.()
2nd Author's Name Shigeo Satoh
2nd Author's Affiliation Fujitsu Laboratories Ltd.
3rd Author's Name Toru Itakura
3rd Author's Affiliation Fujitsu Laboratories Ltd.
Date 1996/9/27
Paper # VLD96-46,ED96-92,SDM96-102
Volume (vol) vol.96
Number (no) 259
Page pp.pp.-
#Pages 6
Date of Issue