Presentation 1996/9/26
Parameter extractions of boron ion implantation using Genetic Algorithms
R. Sudo, S. Kojima, K. Suzuki, M. Sato, K. Suzuki,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) Pearson parameters for impurity distributions were extracted from as-implanted profiles obtained by SIMS. Genetic Algorithms (GA) were applied to extract person parameters. Simulated profiles using parameters extracted by GA agree well with SIMS profiles over a wide range of energies and doses for boron ion implants. To decrease computational time of the parameter extractions, Levenberg-Marquardt method (LM-method) was applied after GA extractions. The total computational time of GA combined with LM-method was 10% compared with GA.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) process simulator / ion implantation / Genetic Algorithms
Paper # VLD96-37,ED96-83,SDM96-93
Date of Issue

Conference Information
Committee VLD
Conference Date 1996/9/26(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To VLSI Design Technologies (VLD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Parameter extractions of boron ion implantation using Genetic Algorithms
Sub Title (in English)
Keyword(1) process simulator
Keyword(2) ion implantation
Keyword(3) Genetic Algorithms
1st Author's Name R. Sudo
1st Author's Affiliation Electron Devices And Materials Laboratories, Fujitsu Laboratories Ltd.()
2nd Author's Name S. Kojima
2nd Author's Affiliation Process development devision, Fujitsu Ltd.
3rd Author's Name K. Suzuki
3rd Author's Affiliation Process development devision, Fujitsu Ltd.
4th Author's Name M. Sato
4th Author's Affiliation Research Center for Computational Science, Fujitsu Ltd.
5th Author's Name K. Suzuki
5th Author's Affiliation Electron Devices And Materials Laboratories, Fujitsu Laboratories Ltd.
Date 1996/9/26
Paper # VLD96-37,ED96-83,SDM96-93
Volume (vol) vol.96
Number (no) 258
Page pp.pp.-
#Pages 8
Date of Issue